Growing community of inventors

San Jose, CA, United States of America

Dongyao Li

Average Co-Inventor Count = 2.14

ph-index = 2

The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.

Forward Citations = 21

Dongyao LiNeil Ira Weisenfeld (3 patents)Dongyao LiPaul Ryvkin (2 patents)Dongyao LiMichal Danek (1 patent)Dongyao LiAnand Chandrashekar (1 patent)Dongyao LiAugusto Manuel Tentori (1 patent)Dongyao LiDenis Pristinski (1 patent)Dongyao LiAtashi Basu (1 patent)Dongyao LiDavid M Fried (1 patent)Dongyao LiAshkan Beyranvand Nejad (1 patent)Dongyao LiPreyas Shah (1 patent)Dongyao LiKapil Umesh Sawlani (1 patent)Dongyao LiPratomo Alimsijah (1 patent)Dongyao LiMichael Bowes (1 patent)Dongyao LiXiaoyan Qian (1 patent)Dongyao LiReynaldo Farias Zorrilla (1 patent)Dongyao LiWilliam Nitsch (1 patent)Dongyao LiDongyao Li (6 patents)Neil Ira WeisenfeldNeil Ira Weisenfeld (10 patents)Paul RyvkinPaul Ryvkin (18 patents)Michal DanekMichal Danek (94 patents)Anand ChandrashekarAnand Chandrashekar (52 patents)Augusto Manuel TentoriAugusto Manuel Tentori (28 patents)Denis PristinskiDenis Pristinski (21 patents)Atashi BasuAtashi Basu (20 patents)David M FriedDavid M Fried (19 patents)Ashkan Beyranvand NejadAshkan Beyranvand Nejad (9 patents)Preyas ShahPreyas Shah (8 patents)Kapil Umesh SawlaniKapil Umesh Sawlani (7 patents)Pratomo AlimsijahPratomo Alimsijah (7 patents)Michael BowesMichael Bowes (4 patents)Xiaoyan QianXiaoyan Qian (3 patents)Reynaldo Farias ZorrillaReynaldo Farias Zorrilla (1 patent)William NitschWilliam Nitsch (1 patent)
..
Inventor’s number of patents
..
Strength of working relationships

Company Filing History:

1. 10X Genomics, Inc. (5 from 393 patents)

2. Lam Research Corporation (1 from 3,797 patents)


6 patents:

1. 12417646 - Systems and methods for image segmentation

2. 12406371 - Systems and methods for image segmentation using multiple stain indicators

3. 12406364 - Systems and methods for spatial analysis of analytes using fiducial alignment

4. D1069162 - Specimen substrate

5. 12223751 - Self-test for imaging device

6. 10977405 - Fill process optimization using feature scale modeling

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