Samsung Display Co., Ltd.

Dongwook Yang

Hyundae Lee

Seunghyun Moon

Byung Ki Chun

Hyeon Jun Lee

Yongseok Choi

Goeun Cha

Kangbin Jo

IlNam Kim

Jongyeop An

Gyeong-ub Moon

Provided is an electronic device including a display panel having defined therein a display region including first to third regions, the display panel being configured to operate in a sensing mode, and including a first pixel in the first region, a second pixel in the second region, and a third pixel in the third region that include a pixel-driving circuit and a light-emitting element, and a first sensor in the first region, a second sensor, and a third sensor that include a sensor-driving circuit and a detection element, and a readout circuit electrically connected to the first, second, or third sensors, wherein, in the sensing mode, the first pixel is configured to emit first light, the second pixel is configured to emit second light, the third pixel is configured to emit no light, and the readout circuit is configured to receive a readout signal from the first sensor.

Electronic device

A display device includes a display panel and a scan driving circuit. The display panel includes a plurality of pixels and a plurality of sensors. The scan driving circuit drives a plurality of scan lines. Pixels in a j-th row among the plurality of pixels are connected to a j-th scan line among the plurality of scan lines, in which j is a positive integer. Sensors, which correspond to the pixels in the j-th row, from among the plurality of sensors are connected to an a-th scan line among the plurality of scan lines, in which a is a positive integer different from j.

Display device

A mask substrate inspection system includes a measurement target module, a camera module, and a control module. The measurement target module includes a mask substrate and a surface light source supplying a light to the mask substrate. The camera module generates image information of the mask substrate using the light from the surface light source. The control module determines whether defects are present in the mask substrate using the image information, without damaging the mask substrate.

Mask substrate inspection system

A data processing device includes a first reference value generator which generates a first reference value corresponding to a ratio of a chromatic color using image signals or first image signals obtained by gamma-compensating the image signals, a white generator which generates a white image signal and second image signals using the first image signals and a second reference value corresponding to an amount of a white data in use, a third reference value generator which generates a third reference value using a first color coordinate corresponding to a color coordinate of the second image signals, a second color coordinate corresponding to a color coordinate of the white image signal, the first reference value, and the second reference value, and a gamut mapper which maps the second image signals to a color coordinate corresponding to the third reference value to generate third image signals.

Data processing device, display device having the same, and gamut mapping method

Growing community of inventors

Suwon-si, South Korea

Dongwook Yang