Samsung Electronics Co., Ltd.

Donghun Kwak

Kitae Park

Daeseok Byeon

Chiweon Yoon

Dongkyo Shim

Hyun Jun Yoon

Cheon An Lee

Hyun-Wook Wook Park

Ji-sang Lee

Sang-Won Park

Won-Taeck Jung

Byung Hei Jun

Sang-Wan Nam

Doohyun Kim

Jinman Han

Sangyong Yoon

Sang-Soo Park

Ingyu Baek

Youngho Lim

Myung-Hoon Choi

Ju Seok Lee

Hee-Woong Kang

Suna Kim

Changyeon Yu

Ho-Chul Lee

Jaewoo Im

Myoung-Won Yoon

Cheonan Lee

Cheon-An Lee

Seung-Cheol Han

A flash memory controller for a flash memory system includes an ECC circuit that receives first page data and second page data read from the flash memory, and respectively counts a first number of fail bits in the first page data and a second number of fail bits in the second page data, an abnormal wordline detector configured to compare the first number of fail bits and second number of fail bits to derive a fail bit change rate between the first page data and the second page data, and generate an abnormal wordline detection signal in response to the fail bit change rate, and a control unit that controls operation of the flash memory in response to the abnormal wordline detection signal.

Flash memory system having abnormal wordline detector and abnormal wordline detection method

A read method of a nonvolatile memory device includes reading data from a selected memory area of the nonvolatile memory device according to a first read voltage; detecting and correcting an error of the read data; and deciding a second read voltage for reading the selected memory area when an error of the read data is uncorrectable. The second read voltage is decided according to either the number of logical 0s or 1s included in the read data, or a ratio of logical 1s to logical 0s in the read data.

Storage device including nonvolatile memory device and read method thereof

A nonvolatile memory device includes a memory cell array having a first plane and a second plane and an address decoder connected to the first plane through first string select lines and connected to the second plane through second string select line. The address decoder provides a string select signal and a string unselect signal to the first and second string select lines. The address decoder independently provides the string select signal and the string unselect signal to the first and second string select lines in each plane based on different string select line addresses corresponding to the first and second planes.

Nonvolatile memory device including multi-plane structure

A nonvolatile memory includes a memory cell array, a row decoder circuit, and a page buffer circuit. The row decoder circuit applies a turn-on voltage to string selection lines, which are connected to string selection transistors of a selected memory block, at a first precharge operation in response to a write command received from an external device. The page buffer circuit applies, in response to the write command, a first voltage to bit lines, which are connected to the string selection transistors, through a first precharge circuit at the first precharge operation regardless of loaded data and applies the first voltage and a second voltage to the bit lines through a second precharge circuit at a second precharge operation based on the loaded data. During the first precharge operation, write data is loaded onto the page buffer circuit.

Nonvolatile memory device with first and second precharge circuit

A nonvolatile memory system includes a nonvolatile memory device and a memory controller that controls the nonvolatile memory device. The nonvolatile memory device includes multiple memory blocks. Each of the memory blocks includes memory cells. Each of the memory cells has any one of an erase state and one of multiple different program states. An operation method of the nonvolatile memory system includes receiving a physical erase command from an external device. The operation method also includes performing a fast erase operation, responsive to the received physical erase command, with respect to at least one memory block so that first memory cells of the at least one memory block have a fast erase state different from the erase state.

Operation method of nonvolatile memory system that includes erase operations, fast erase operations, program operations and fast program operations

A method of operating a storage device having a nonvolatile memory including at least one memory block having a plurality of sub-blocks includes reading backup data of backup memory cells having a highest program state among a plurality of memory cells connected to at least one word line of a sub-block which is not erase-requested adjacent to an erase-requested sub-block among the sub-blocks. The method includes storing the backup data, erasing the erase-requested sub-block, and reprogramming the backup memory cells having the highest program state on the basis of the backup data.

Nonvolatile memory device and operation method of storage device including the nonvolatile memory device

Nonvolatile memory device with improved reliability and operating speed

A programming method of a nonvolatile memory device including; programming data in memory cells connected to a word line by performing a coarse program operation; and programming the data in the memory cells by performing a fine program operation, wherein the number of program states in the coarse program operation is changed according to a program/erase (P/E) cycle number.

Storage device and a write method including a coarse program operation and fine program operation

An operating method of a storage device which includes a nonvolatile memory is provided. The operating method includes performing a first program operation on selected memory cells of the nonvolatile memory and storing a first time when the first program operation is performed; and adjusting a program parameter according to a difference between the first time and a second time, and performing a second program operation on the selected memory cells using the adjusted program parameter, the second time being a time when the second program operation is performed.

Operating method of storage device

A nonvolatile memory device includes at least two strings that are vertically stacked on a substrate and share one bit line. A program method of the nonvolatile memory device includes setting a pre-charge condition on the basis of a disturb environment between the at least two cell strings, pre-charging or not pre-charging an unselected cell string among the at least two cell strings in response to the pre-charge condition and programming memory cells in a selected cell string among the at least two cell strings.

Nonvolatile memory device and program method thereof

A storage device includes a nonvolatile memory device including memory blocks and a controller configured to control the nonvolatile memory device. Each of the memory blocks includes a plurality of cell strings each including at least one selection transistor and a plurality of memory cells stacked on a substrate in a direction perpendicular to the substrate. The controller controls the nonvolatile memory device to perform a read operation on some of selection transistors of a selected one of the memory blocks and to perform a program operation on the selection transistors of the selected memory block according to a result of the read operation.

Storage device including nonvolatile memory device and controller

According to example embodiments, a nonvolatile memory includes a plurality of memory cells and a plurality of bit lines respectively connected to the plurality of memory cells, and a method of programming the nonvolatile memory includes loading data to the nonvolatile memory for a first program operation, starting the first program operation on the plurality of memory cells, based on the loaded data, and loading at least two page data to the nonvolatile memory before the first program operation is completed. The at least two page data include first page data and second page data for a second program operation following the first program operation. The first page data and the second page data respectively correspond to a first bit and a second bit to be programmed at a memory cell among the plurality of memory cells.

Memory system including nonvolatile memory and memory controller and programming method for programming data into nonvolatile memory

A program method for a memory system including a three-dimensional nonvolatile memory having multi-level memory cells and a random access memory. The method uses the random access memory to variously store selected bits of multi-bit data during the programming of a row of memory cells in the three-dimensional nonvolatile memory.

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Hwaseong-si, South Korea

Donghun Kwak