Tsinghua University

Dong Wu

Liyang Pan

Xinhong Hong

Xinyi Li

Huaqiang Wu

He Qian

A neuron simulation circuit and a neural network apparatus. The neuron simulation circuit includes an operational amplifier, a first resistive device and a second resistive device. The operational amplifier includes a first input terminal, a second input terminal, and an output terminal. The first resistive device is connected between the first input terminal or the second input terminal of the operational amplifier and the output terminal of the operational amplifier. The second resistive device is connected between the output terminal of the operational amplifier and an output terminal of the neuron simulation circuit. The second resistive device includes a threshold switching memristor, and a first terminal of the threshold switching memristor is electrically connected with the output terminal of the neuron simulation circuit. At least one of the first resistive device and the second resistive device includes a dynamic memristor.

Neuron simulation circuit and neural network apparatus

The random access memory includes: two identical memory cell arrays, a data write circuit and a data read circuit. Array structures of the two identical memory cell arrays are the same, and same original stored information is stored in memory cells with a same address in the two identical memory cell arrays. The data write circuit is configured to write same data into the memory cells with the same address in the two identical memory cell arrays. The data read circuit is configured to select two pieces of stored information from the memory cells with the same address in the two identical memory cell arrays, and to output '0' if the two pieces of stored information are different or output one of the two pieces of stored information if the two pieces of stored information are the same.

Structure and methods of operating two identical 4T random access memories storing the same data

The present disclosure provides a cell structure, a random access memory and operation methods. The cell structure with four transistors, including a first N-type transistor, a first P-type transistor, a second N-type transistor and a second P-type transistor, in which an absolute value of a threshold voltage of the first N-type transistor is greater than an absolute value of a threshold voltage of the second N-type transistor, and an absolute value of a threshold voltage of the first P-type transistor is greater than an absolute value of a threshold voltage of the second P-type transistor. The random access memory, including: two identical memory cell arrays including the cell structure with four transistors, a data write circuit and a data read circuit, by using Two Modular Redundancy harden method, and thus reading correctly and avoiding the mistake reversal caused by the single event upset effect.

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Beijing, China

Dong Wu