Samsung Electronics Co., Ltd.

Dong Ki Min

Young Gu Jin

Tae Chan Kim

Kwang Hyun Lee

Tae Yon Lee

Dae Kwan Kim

Min Ho Kim

Tae Seok Oh

Sang Chul Sul

Wang Hyun Kim

Se Hwan Yun

Young Jin Kim

Yoon Dong Park

Hyuk Soon Choi

Chae Sung Kim

Ju Hwan Jung

Yo Hwan Noh

Jong Min You

Joon Hyuk Im

Jung Hoon Jung

Eric R Fossum

Yibing Michelle Wang

Ilia Ovsiannikov

Ji Hye Kim

Seung Hoon Lee

Kyoung Lae Cho

Young-Gu Jin

Tae-Chan Kim

Moo Young Kim

Tae-Yon Lee

Tae-Seok Oh

Kwang-Hyun Lee

Je Il Ryu

Sang-Chul Sul

Seung Bum Hong

Ha Young Ko

Hoon Sang Oh

Seok Yong Hong

Jae Pil Kim

Jung Yeon Kim

Seong Yeong Jeong

Young Mi Jo

Keun Yung Byun

Dong Seok Suh

Sun Hwa Jung

Yong Seong Kim

Da Hee Lee

Eun Je Hyun

Hye Kyoung Jung

Tae Shick Wang

An image processing device comprises an image sensor including unit groups comprising a reference group and a conversion group each including pixels and color filters, and is configured to generate image data using the pixels, and an image signal processor which is configured to calculate a hash of the image data, and to select a filter corresponding to the hash to perform filtering, wherein the image signal processor includes a pixel index converter which is configured to convert indexes of the pixels based on a positional relationship between the pixels, a pixel property converter which is configured to convert the properties of the pixels and to convert the hash before conversion, and a filter coefficient converter which is configured to convert filter coefficients of the pixels based on the respective converted pixel index and the respective converted pixel property.

Image processing device and image processing method using the same

An RGBW image sensor, a binning method in an image sensor, and a computer readable medium for performing the method are provided, and the binning method in an image sensor includes selecting one or more binning target pixels for each of a red pixel, a green pixel, a blue pixel, and a white pixel, constituting a pixel array of an RGBW image sensor with a uniform array pattern, generating binning pixel data for each of the red pixel, the green pixel, the blue pixel, and the white pixel, based on pieces of pixel data corresponding to the binning target pixel, and rearranging pixels, represented by the binning pixel data, to be equal to the entirety or a portion of the uniform array pattern and to be equally spaced apart from each other.

RGBW image sensor, binning method in image sensor and computer readable medium for performing the method

An image sensor includes a pixel array that includes a plurality of pixels, a first interface directly connected to an external gyro sensor and that receives gyro data output by the gyro sensor in response to motion, and a control logic that generates image data by exposing the plurality of pixels for a predetermined exposure period, generates valid data that correspond to the exposure period using the gyro data, and generates, based on the valid data, compensation information that represents a movement path of the motion.

Image sensor and electronic device comprising the same

An image sensor according to an example embodiment concepts includes a pixel array including pixels, and each of the pixels includes photoelectric conversion elements. The photoelectric conversion elements independently operating to detect a phase difference. The image sensor further includes a control circuit configured to independently control exposure times of each of the photoelectric conversion elements included in each of the pixels.

Image sensor including a pixel having photoelectric conversion elements and image processing device having the image sensor

An autofocus method includes receiving a left image having a first blurriness value and a right image having a second blurriness value, filtering the left image so that the first blurriness value becomes the same as the second blurriness value, and generating a control signal for controlling the lens module based on a difference between a third blurriness value of a filtered left image and the second blurriness value.

Method of operating image signal processor and method of operating imaging system including the same

An image signal processor includes a memory configured to store a table, the table including a plurality of point spread functions (PSFs), a PSF selection circuit configured to output at least one of the plurality of PSFs stored in the table based on selection information, a disparity extractor configured to extract a disparity value from image data corresponding to pixel signals output from at least one pixel of a plurality of pixels included in an image sensor, and a processing circuit configured to generate pixel location information for the at least one pixel. Each of the pixels of the plurality of pixels includes a plurality of photoelectric conversion elements. The selection information includes the disparity value and the pixel location information.

Image signal processor and devices including the same

ACMOS image sensor includes a pixel array having a plurality of pixels. Each of the plurality of pixels includes: a photogate structure configured to be controlled based on a first gate voltage; and a sensing transistor including a charge pocket region formed in a substrate region, the sensing transistor being configured to be controlled based on a second gate voltage. Based on the first gate voltage, the photogate structure is configured to integrate charges generated in response to light incident on the substrate region. The sensing transistor is configured to adjust at least one of a threshold voltage of the sensing transistor and a current flow in the sensing transistor according to charges transferred from the photogate structure to the charge pocket region based on a difference between the first gate voltage and the second gate voltage.

CMOS image sensors with photogate structures and sensing transistors, operation methods thereof, and image processing systems including the same

A method of calculating, using a depth sensor, a distance excluding an ambiguity distance including outputting a modulated light signal output from a light source to an object, receiving the modulated light signal reflected by the object, calculating a distance between the light source and the object using the reflected modulated light signal input to photo gates in conjunction with demodulation signals supplied to the photo gates, the calculating including calculating, using the modulated light signal, at least one distance farther than a maximum measurable distance, and setting the at least one distance to be equal to the maximum measurable distance may be provided. A range of the distance farther than the maximum measurable distance can be determined according to a duty ratio of the modulated light signal.

Methods for calculating distance using depth sensor and apparatuses performing the same

An image sensor chip includes a first wafer and a second wafer. The first wafer includes an image sensor having a plurality of sub-pixels, each of which is configured to detect at least one photon and output a sub-pixel signal according to a result of the detection. The image processor is configured to process sub-pixel signals for each sub-pixel and generate image data. The first wafer and the second wafer are formed in a wafer stack structure.

Image sensor chips

An image sensor includes a pixel array and a row driver block. The pixel array includes a plurality of subpixel groups, each including a plurality of subpixels. Each of the plurality of subpixels is configured to generate a subpixel signal corresponding to photocharge accumulated in response to a photon. The row driver block is configured to generate a first control signal to control the subpixels included in each of the plurality of subpixel groups to accumulate the photocharge in parallel from a first time point to a second time point.

Image sensor and image processing system including subpixels having a transfer circuit, comparator and counter for outputting the count value as the subpixel signal

A binary complementary metal-oxide-semiconductor (CMOS) image sensor includes a pixel array and a readout circuit. The pixel array includes at least one pixel having a plurality of sub-pixels. The readout circuit is configured to quantize a pixel signal output from the pixel using a reference signal. The pixel signal corresponds to sub-pixel signals output from sub-pixels, from among the plurality of sub-pixels, activated in response to incident light.

Binary CMOS image sensors, methods of operating same, and image processing systems including same

A depth calculation method of a depth sensor includes outputting a modulated light to a target object, detecting four pixel signals from a depth pixel based on a reflected light reflected by the target object, determining whether each of the four pixel signals is saturated based on results of comparing a magnitude of each of the four pixel signals with a threshold value, and calculating depth to the target object based on the determination result.

Depth sensor, method of calculating depth in the same

A method includes providing packets to demodulate a modulated photon signal output from a light source, wherein each packet includes a first interval and a second interval, and providing oscillation signals respectively having different phases from one another to photogates during the first interval of each of the packets. The light source is disabled and a direct current (DC) voltage is provided to the photogates during the second interval of each of the packets.

Sensor, method of operating the same, and system including the same

An image sensor includes a first photoelectric conversion element supplying charges to a first charge storage node, a first charge storage element adjusting an amount of charges supplied from a charge supply source to the first charge storage node in response to a feedback signal, and a feedback signal generating circuit generating the feedback signal based on an amount of charges in the first charge storage node.

Image sensor, operating method thereof, and device including the image sensor

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Seoul, South Korea

Dong Ki Min