Skhynix Inc.

Dong Hun Kwak

Se Chun Park

Hyun Seob Shin

Chan Hui Jeong

Yeong Jo Mun

Hyung Jin Choi

Suk Hwan Choi

Jae Yeop Jung

Tae Hun Park

Sung Hyun Hwang

Jong Kyung Park

Woo Pyo Jeong

A memory device includes: memory cells connected between a common source line and bit lines; a source line driver for applying a common source line voltage to the common source line and then floating the common source line; and a program operation controller for controlling the source line driver to change a length of a floating period in which the common source line is floated, based on a degree to which a program operation on the memory cells is performed.

Memory device and operating method of the memory device for reducing power consumption for program operation

A semiconductor device includes a gate structure including a first select line, a second select line, a first wordline, a second wordline, and a third select line. The semiconductor device also includes a first channel layer passing through the second wordline and the third select line. The semiconductor device further includes a second channel layer passing through the first wordline and the first select line, the second channel layer connected to the first channel layer, and a third channel layer passing through the first wordline and the second select line, the third channel layer connected to the first channel layer. The semiconductor device additionally includes an isolation structure that isolates the second channel layer from the third channel layer.

Semiconductor device having channel isolation structure

The present technology relates to an electronic device. According to the present technology, a memory device may include a plurality of memory cells, a peripheral circuit, and a control logic. The peripheral circuit may perform a fail bit detection operation on memory cells selected from among the plurality of memory cells. The control logic may control the peripheral circuit to set target parameters related to a main operation based on a comparison result between a fail bit detection time measured in the fail bit detection operation and a reference time, and perform the main operation on the selected memory cells based on the target parameters.

Memory device and method of operating the same

A method of operating a controller includes transmitting a program command to a memory device, receiving a message indicating that a program operation corresponding to the program command is failed from the memory device, and transmitting an erase command for performing an erase operation on a page corresponding to the program command to the memory device in response to the message.

Method of operating a controller and a memory device related to recovering data

The present technology relates to an electronic device. According to the present technology, a memory device may include a plurality of memory cells, a read and write circuit, and a program controller. The plurality of memory cells may be connected to a plurality of channels passing through a plurality of word lines. The program controller may control the read and write circuit to perform a sensing operation on first memory cells and second memory cells among the plurality of memory cells during differently set sensing time periods. The first memory cells may be connected to first channels adjacent to a plurality of slits, among a plurality of channels separated by the plurality of slits. The second memory cells may be connected to second channels farther from the plurality of slits than the first channels.

A memory device includes: a memory block including a plurality of memory cells; a peripheral circuit for performing a program operation on selected memory cells among the plurality of memory cells; and a control logic for controlling the program operation of the peripheral circuit. The control logic controls the peripheral circuit to perform a foggy program operation on first memory cells connected to a first word line among the plurality of memory cells, perform a foggy program operation on second memory cells connected to a second word line adjacent to the first word line among the plurality of memory cells, and perform a fine program operation on the first memory cells, based on a target program state of the second memory cells.

Memory device performing program operation

A storage device includes a memory device and a controller. The memory device includes a memory region configured by a plurality of memory cells. The controller is configured to set at least one prohibited threshold voltage distribution for the memory region based on a result of an operation on the memory region.

Storage device for setting prohibited threshold voltage distribution

A memory device includes memory cells connected to a plurality of word lines. The memory device also includes a read operation performer configured to perform a read operation of applying an equalizing voltage to the plurality of word lines and applying a read voltage to a selected word line. The memory device further includes a fail cell counter configured to count a number of on cells among selected memory cells connected to the selected word line at each of time points. The memory device additionally includes a read operation controller configured to control the read operation performer to determine a length of an evaluation period based on a result of comparing the number of on cells at each of the time points, and configured to sense a voltage of bit lines respectively connected to the selected memory cells after the evaluation period elapses from the time.

A method of operating a memory device includes performing a first program operation on first memory cells connected to a first channel region among a plurality of channel regions formed by separating one channel hole into the plurality of channel regions, based on a first verify voltage. The method also includes performing a second program operation on second memory cells connected to a second channel region among the plurality of channel regions, based on a second verify voltage. The method further includes determining third memory cells having a threshold voltage lower than a target threshold voltage distribution among the first memory cells while performing the second program operation. The method additionally includes performing a third program operation on the third memory cells.

Memory device performing program operation and method of operating the same

A memory device includes a plurality of memory cells, where each memory cell is configured to be in an erased state or one of a plurality of program states according to data stored therein. The memory device also includes a peripheral circuit configured to, in a program operation on the plurality of memory cells, perform a first program voltage application operation on first memory cells, the first memory cells being to be programmed to first respective program states. The peripheral circuit is also configured to perform, after the first program voltage application operation, a pre-program voltage application operation on second memory cells, the second memory cells being to be programmed to second respective program states.

Memory device

A memory device includes a precharge time information storage for storing information on a first precharge time for which a bit line control signal is applied and a second precharge time for which a source line control signal is applied, which are determined according to a degree to which a program operation is performed. The memory device also includes a precharge voltage controller for providing the bit line control signal and the source line control signal respectively to page buffers and a source line driver for a longer precharge time selected from the first precharge time and the second precharge time in the program operation.

Nonvolatile memory device including selective bit line and source line precharge times and operating method thereof

Provided herein may be a memory device and a method of operating the same. The memory device may include a plurality of memory cells coupled between a common source line and a bit line, a peripheral circuit configured to perform a plurality of program loops, each including a program voltage application operation of applying a program voltage to a selected memory cell and a verify operation of verifying a program state of the selected memory cell, and a control logic configured to control, at the program voltage application operation, the peripheral circuit to apply a precharge voltage to the common source line and change at least one of a magnitude of the precharge voltage and a time during which the precharge voltage is applied, depending on a magnitude of the program voltage.

Memory device for performing program operation and method of operating the same

Provided herein may be a memory device and a method of operating the same. The memory device may include a plurality of memory cells, a program operation performer configured to perform a plurality of program loops on the plurality of memory cells, a step voltage calculator configured to calculate a step voltage, the step voltage being a difference of magnitude between program voltages that are applied in any two consecutive program loops, a reference bit determiner configured to determine a reference number of fail bits based on a magnitude of the step voltage, and a verification result generator configured to generate verification result information based on a result of a comparison between the reference number of fail bits and a number of on-cells, among the plurality of memory cells, identified in a verify operation that is included in a program loop, among the plurality of program loops.

A semiconductor memory device includes a plurality of memory blocks and a contact region. Each of the plurality of memory blocks includes a plurality of memory cells. The contact region is formed between the plurality of memory blocks. The semiconductor memory device uses a first memory block that is not adjacent to the contact region and a second memory block adjacent to the contact region among the plurality of memory blocks differently.

Semiconductor memory device and method of operating the semiconductor memory device

Provided herein may be a memory device and a method of operating the same. The memory device may include a plurality of memory cell strings, a peripheral circuit configured to, using a plurality of read voltages, perform a read operation that reads data that is stored in a selected memory cell that is included in a selected memory cell string, and an operation controller configured to control the peripheral circuit to perform the read operation by using a first read voltage, a first potential adjustment operation, and the read operation by using a second read voltage that is lower than the first read voltage, wherein the first potential adjustment operation is an operation that applies a first turn-on voltage to unselected source select lines that are coupled to unselected memory cell strings for a first period and thereafter applies a ground voltage to the unselected source select lines.

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Icheon-si, South Korea

Dong Hun Kwak