Samsung Electronics Co., Ltd.

Intekplus Co., Ltd.

Dong-Hae Son

Ssang-Gun Lim

Chang-Hyun Ryu

Poom-Seong Park

An apparatus to test a semiconductor package includes a vertical illuminator to supply vertical illumination in the same axial direction as a measurement target and a vertical image unit to capture a vertical image of the measurement target so that a testing apparatus may 2-dimensionally determine information on the shape, size, or position of a solder ball. An inclined illuminator may supply inclined illumination in a different axial direction from the measurement target, and an inclined image capture unit may capture a side image of the measurement target so that the testing apparatus may 3-dimensionally determine information on a state of contact of the solder ball with the ball land. The inclined image capture unit may include a color camera using color information, thereby markedly increasing test reliability and yield.

Growing community of inventors

Asan-si, South Korea

Dong-Hae Son