Stmicroelectronics S.r.l.

Atmel Corporation

Donato Ferrario

Giovanni Campardo

Rino Micheloni

Stefano Ghezzi

Lorenzo Bedarida

Simone Bartoli

Marco MacCarrone

Fabio Tassan Caser

Carla Maria Golla

Stefano Surico

Matteo Zammattio

Davide Manfre′

Mauro Chinosi

Guido Lomazzi

Maria Mostola

Emilio Yero

Davide Manfre'

A precharge and evaluation circuit for a memory sense amplifier includes a first precharge-phase transistor having a source coupled to a power-supply potential, a gate coupled to a precharge control line, and a drain. A second precharge-phase transistor has a drain coupled to the drain of the first precharge-phase transistor, a source, and a gate coupled to the source through a feedback circuit. A first read-phase transistor has a source coupled to the power-supply potential, and a gate and drain coupled to a comparator. A second read-phase transistor has a drain coupled to the drain of the first read-phase transistor, a source coupled to the source of the second precharge-phase transistor, and a gate coupled to the source of the second read-phase transistor through a feedback circuit. A column decoder is coupled to the sources of the second precharge-phase and second read-phase transistors.

Precharge and evaluation phase circuits for sense amplifiers

A sensing circuit. In one embodiment, the sensing circuit includes a memory circuit including a first bitline that sinks a first leakage current, a compensation device coupled to the memory circuit, and a compensation circuit coupled to the compensation device. The compensation circuit includes a second bitline that sinks a second leakage current that matches the first leakage current. The compensation device is operative to compensate the first leakage current through a current based on the second leakage current. According to the system and method disclosed herein, the compensation device and compensation circuit prevents errors when determining the state of the memory cell.

Column leakage compensation in a sensing circuit

A method and system for managing a buffered program operation for plurality of words is described. In one aspect, the method and system include providing an internal buffer including a plurality of locations and at least one bit location for the plurality of locations. Each of the words is stored in a location of the plurality of locations. The words are associated with internal address bits for the locations. At least one of the internal address bits is at least one group address bit that corresponds to all of the words. A remaining portion of the internal address bits is associated at least one of the words. The at least one bit location stores the at least one group address bit for the words. Thus, in one aspect, the method and system include storing each of the words one of the buffer locations. The method and system also include associating the at least one group address bit with the buffer location for each of the words.

Method and system for managing address bits during buffered program operations in a memory device

A programmable logic array (PLA) includes at least one AND plane including an array of transistors arranged in rows and columns. The transistors belonging to a same column may be connected in series with each other. Two end conduction terminals of the series connected transistors may be coupled to a supply voltage rail and to a reference, respectively. The transistors of the first and last rows of the array may have their control terminals coupled to respective opposite enabling/disabling potentials. Except for the first and last rows, first, second, and third control lines are associated with each row of the array. Except for the first and last rows, each transistor of each row may have its control terminal connected to one of the three control lines associated with its row. The PLA may alternatively include at least one OR plane.

Programmable logic arrays

An electronic counter for a semconductor-integrated non-volatile memory device includes a single count cell connected with its output to at least one storage element The count cell comprises a summing block of the half-adder type and a master portion of a master/slave flip-flop of which said storage element is a slave portion. Advantageously, the master portion has an output connected to the input side of a number n of slave registers arranged in parallel.

Electronic counter for a non-volatile memory device integrated on a semiconductor

The invention relates to a method and a circuit for regulating a pulse synchronization signal (ATD) for the memory cell read phase in semiconductor integrated electronic memory devices. The pulse signal (ATD) is generated upon detection of a change in logic state of at least one of a plurality of address input terminals of the memory cells, so as to also generate an equalization signal (SAEQ) to a sense amplifier. The SAEQ pulse is blocked (STOP) upon the row voltage reaching a predetermined sufficient value to provide reliable reading. Advantageously, the pulse blocking is produced by a logic signal (STOP) activated upon a predetermined voltage value being exceeded during the overboost phase of the addressed memory row.

Method and circuit for regulating the length of an ATD pulse signal

A boosting circuit supplied by a first voltage level and a second voltage level, and having an output line capable of taking a third voltage level, the circuit having at least two distinct circuits for generating the third voltage level, the at least two circuits selectively activatable for generating the third voltage level and selectively coupleable to the output line.

Boosting circuit, particularly for a memory device

A row decoding circuit for an electronic memory cell device, particularly in low supply voltage applications, is described. The row decoding circuit is adapted to boost, through at least one boost capacitor, a read voltage to be applied to a memory column containing a memory cell to be read. The circuit is powered between a first supply voltage reference and a second ground potential reference, and comprises a hierarchic structure of cascade connected inverters and a circuit means of progressively raising the read voltage level dynamically. First means are provided for raising the read voltage level to a value equal to the supply voltage plus a threshold voltage, and second means are provided for raising the read voltage level to a value equal to the supply voltage plus twice said threshold voltage.

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Carugate, Italy

Donato Ferrario