Stmicroelectronics S.r.l.

Donato Corona

Antonio Giuseppe Grimaldi

Nicolo′ Frazzetto

Monica Micciche′

Corrado Iacono

Salvatore Pisano

Giovanni Samma Trice

Sebastiano Amara

Giovanni Sammatrice

An embodiment of an integrated electronic device formed in a body of semiconductor material, which includes: a substrate of a first semiconductor material, the first semiconductor material having a first bandgap; a first epitaxial region of a second semiconductor material and having a first type of conductivity, which overlies the substrate and defines a first surface, the second semiconductor material having a second bandgap wider than the first bandgap; and a second epitaxial region of the first semiconductor material, which overlies, and is in direct contact with, the first epitaxial region. The first epitaxial region includes a first buffer layer, which overlies the substrate, and a drift layer, which overlies the first buffer layer and defines the first surface, the first buffer layer and the drift layer having different doping levels.

Integrated electronic device and method for manufacturing thereof

An insulated gate semiconductor device, comprising: a semiconductor body having a front side and a back side opposite to one another; a drift region, which extends in the semiconductor body and has a first type of conductivity and a first doping value; a body region having a second type of conductivity, which extends in the drift region facing the front side of the semiconductor body; a source region, which extends in the body region and has the first type of conductivity; and a buried region having the second type of conductivity, which extends in the drift region at a distance from the body region and at least partially aligned to the body region in a direction orthogonal to the front side and to the back side.

Insulated gate semiconductor device with optimized breakdown voltage, and manufacturing method thereof

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Augusta, Italy

Donato Corona