Wells Electronics, Inc.

Amp LLC

Donald W Milbrand, Jr

Richard L Marks

Leonard K Espenshade

Mark J Zitto

Dimitry G Grabbe

Richard F Granitz

Earl E Masterson

Roel J Bakker

A connector for an integrated circuit (IC) chip to secure the IC chip during testing. The connector includes a unique latching system with a pivotal contact pad carried beneath a latch plate for self-adjusting alignment prior to engaging the leads of the IC chip. The latching system also includes an actuator and hook member pivotally connected to the latch plate in an over center movement fashion to increase the clamping force uniformly across IC leads.

Latching IC connector

A socket for securing an integrated circuit (IC) during burn-in or test procedures. The socket includes a base which carries a plurality of electrically conductive contacts. Opposed hold down rollers are shiftably journaled in the base. The socket also includes a movable top connected to the base and a contact with the rollers. Movement of the top shifts the rollers between secured and open positions. A rotatable lever housed in the base is connected to an actuating arm which is also shiftable by movement of the top. The lever is operably associated with the contacts and shifts the contacts between an operative position in contact with the IC chip leads and a standby position spaced from the IC chip leads.

Chip carrier socket

A socket for securing an integrated circuit (IC) during burn-in or test procedures. The socket includes a base which carries a plurality of electrically conductive contacts. Opposed hold down latches are shiftably connected to the base and include outer cams. The socket also includes a movable top which has an integral nib for contacting the latch cams to effect shifting of the latches. A rotatable lever housed in the base is connected to an actuating arm which is shiftable by movement of the top. The lever is operably associated with the contacts and shifts the contacts between an operative position in contact with the IC leads and a standby position spaced from the leads.

Socket for integrated circuit carrier

A connector for an integrated circuit (IC) to secure the IC during testing. The connector includes a unique latching system which includes an actuator and a hook which are pivotally connected in an over-center movement fashion to significantly increase the clamping force from the force applied to latch the actuator or a connected latch plate.

The present invention is directed to a multi-pin coax connector assembly having connector housings made of metal or conductive plastic which serves as a reference ground for all signals. The connectors have passages extending therethrough. Pin and socket terminals are insert molded with insulating material and are positioned in the passages. The insulating material spaces the terminals from the conductive connector housing as well as providing air gaps along most of the length of the terminals. The air gaps cooperate with the insulating material to provide controlled impedance. As the signals travel at a high rate of speed along the terminals, the terminals are bent to minimize the reflection of the signal. The connectors are provided with power and ground busses along the outside surfaces thereof, the busses of the first connector making electrical connection with the respective busses of the second connector. A camming assembly means is also provided to cam the terminals of the connectors together, which provides for a positive wipe action as the terminals of the connectors are cammed into electrical engagement with each other. The camming assembly means also allows for reduced insertion force of the connectors, as the terminals of one connector do not engage the terminals of the other connector until the camming assembly means is operated.

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Mechanicsburg, PA, United States of America

Donald W Milbrand, Jr