Green Mountain Semiconductor Inc.

International Business Machines Corporation

Qimonda Ag

Donald W Labrecque

Wolfgang Hokenmaier

Ryan A Jurasek

Christopher P Miller

Christopher W Scoville

Steffen A Loeffler

Ralf Klein

Margaret Freebern

Steffen Loeffler

Aaron D Willey

A novel architecture provides many of the advantages of the array and datapath architecture of DRAM products that do not utilize ECC (error correction code) functionality, while simultaneously allowing the flexible deployment of ECC error correction as needed. Aspects of the disclosure enable the minimization of write and read latency typically introduced by the implementation of ECC error correction. Sharing of circuit components between neighboring memory regions is also introduced, which allows for a reduction in circuit area as well as a reduction in loading on speed-critical data bus wiring, which improves overall performance. A very fast single error correct (SEC) and double error detect (DED) read-out for real-time system-level awareness is also provided.

Flexible, low-latency error correction architecture for semiconductor memory products

A highly configurable, extremely dense, high speed and low power artificial neural network is presented. The architecture may utilize DRAM cells for their density and high endurance to store weight and bias values. A number of primary sense amplifiers along with column select lines (CSLs), local data lines (LDLs), and sense circuitry may comprise a single neuron. Since the data in the primary sense amplifiers can be updated with a new row activation, the same hardware can be reused for many different neurons. The result is a large amount of neurons that can be connected by the user. Training can be done in hardware by actively varying weights and monitoring cost. The network can be run and trained at high speed since processing and/or data transfer that needs to be performed can be minimized.

Dynamic random-access memory with embedded artificial neural network functionality

An extremely dense, high speed, and low power content addressable DRAM is presented. To enable a parallel searching, a data word to be searched may be driven onto column select lines (CSLs) of a DRAM array. Although two or more primary sense amplifiers typically are not connected at the same time to the same local data line during operation of a DRAM, in various embodiments presented herein, some or all sense amplifiers in a DRAM can be activated simultaneously to enable maximum parallelism with local data line sharing being explicitly allowed. Using this architecture, a data word can be simultaneously searched in all banks and with multiple wordlines. Since no input/output transactions are required and no data needs to be driven from the bank during execution of a search, overall current, and thus power usage, can be reduced.

Content addressable dynamic random-access memory with parallel search functionality

Various embodiments include an integrated circuit (IC) structure having: a chip control logic; a chip power system connected with the chip control logic; and a voltage island connected with the chip control logic and the chip power system, the voltage island including: an interface component for interfacing with the chip power system and the chip control logic; a logic island connected with the interface component; and a voltage island power system connected with the interface component and the logic island, the voltage island power system independently controlling a voltage supplied to the logic island.

Integrated circuit having regulated voltage island power system

An integrated circuit includes a memory array, first pads, and second pads. The integrated circuit is configured to operate in a first mode and in a second mode. The first mode includes receiving data signals on the first pads and address signals on the second pads to access the memory array. The second mode includes receiving multiplexed data signals and address signals on the first pads to access the memory array.

Growing community of inventors

Colchester, VT, United States of America

Donald W Labrecque