Radiation Measurements, Inc.

Donald R Jacobson

A measuring tool (10) for determining the thickness and position of the X-ray beam of a computer is disclosed which allows the information about the X-ray beam to be derived by analysis of a tomographic image taken of the measuring tool. The measuring tool (10) includes a phantom (12) which has formed therein a plurality of receptacles (14) which receive inserts (16). At least two of the inserts (16) each include therein an image creating pattern (20) including a helical pattern (22) and a center indicator (24) so that both thickness and positioning information can be obtained from the computer-generated tomographic image taken of the tool by examining the images created of the helical patterns (22) and center indicators (24) in the inserts (16).

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Madison, WI, United States of America

Donald R Jacobson