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Inficon Gmbh

Holve, Donald John

Donald John Holve

Michel Pierre Bonin

William Henry Benner

Aaron Stibbich

Apparatuses, methods, and systems are disclosed for analyzing particles from about 0.001 to about 1 &#x3bc;m in diameter by controlling a gaseous medium through which the particles travel so that properties of the particles, such as diameter, electrical mobility, and charge, are measured. One embodiment of the disclosed apparatuses includes a particle source generator, a nozzle, a chamber, an electronic gate, and a detector. Resolution of the measurements made by the disclosed apparatuses is improved by use of a mathematical deconvolution of a spread in arrival times generated by particles of different sizes and charge levels and non-ideal background flow velocity variations.

Apparatuses, processes, and systems for measuring particle size distribution and concentration

Apparatuses, methods, and systems for measuring mean particle size and concentration of a polydispersion of agglomerates are disclosed. In one embodiment, the apparatuses include a light source; a focusing lens to form a probe volume; a first light detector positioned at a first angular position from the beam of light; and a second light detector positioned at a second angular position from the first direction of the beam of light, the mean particle size and concentration being determined using nearly invariant functions of a ratio of the light scattered measured by the first and second detectors.

Laser-based apparatus and method for measuring agglomerate concentration and mean agglomerate size

A novel method for analyzing the pulse train resulting from a scanned beam particle monitor is described. The method enhances signal-to-noise ratio and significantly reduces particle false alarm rate. Performed in the time domain, the method filters noise pulses that do not occur at the scanner frequency. The analysis further identifies particle-pulse-envelopes (PPE's) by performing a forward-looking and backward-looking autocorrelation. Gaussian fits are subsequently applied to identified particle-pulse envelopes, to determine particle characteristics, such as size and speed.

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Berkeley, CA, United States of America

Donald John Holve