Lockheed Martin Corporation

Donald George Polensky

Nicolas James Deshler

James G Hawley

Provided herein are various enhanced techniques for ultraviolet decontamination via emission of ultraviolet radiation and tracking emission exposure. An example method includes obtaining an emission characteristic for a radiation source. The method also includes capturing a depth map of a scene comprised of one or more objects and processing the depth map and an emission characteristic to determine an indication of exposure levels of the one or more objects to radiation emitted by the radiation source. An exposure visualization is generated based at least on the indication of exposure levels and displaying the exposure visualization.

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Morgan Hill, CA, United States of America

Donald George Polensky