Agere Systems Inc.

Lsi Corporation

Agere Systems Guardian Corp.

Donald Earl Hawk, Jr

Yehuda Smooha

Charles Cohn

Parag Madhani

Paul F Barnes

Kandaswamy Prabakaran

Kerry Leeds Davison

Ashley Rebelo

Allen S Lim

John J Krantz

Richard J Sergi

Stephen M King

Jeffrey M Klemovage

One aspect provides an integrated circuit (IC) packaging assembly that comprises a substrate having conductive traces located thereon, wherein the signal traces are located in an IC device region and the power traces are located in a wafer level fan out (WLFO) region located lateral the IC device region. This embodiment further comprises a first IC device located on a first side of the substrate within the IC device region and that contacts the signal traces in the IC device region. A second IC device is located on a second side of the substrate opposite the first side and overlaps the IC device region and the WLFO region. The second IC device contacts a first portion of the signal traces in the IC device region and contacts a first portion of the power traces in the WLFO region.

Multi-chip stacking of integrated circuit devices using partial device overlap

A method of determining signal routing in an integrated circuit includes providing first coordinates of an input/output cell and second coordinates of an input/output pad to a parametric routing module. The parametric routing module receives at least one wire path parameter. The parametric routing module uses the at least one connection path parameter to determine a physical dimension of a wire path between the first coordinates and the second coordinates.

Method for computing IO redistribution routing

A method of generating a model of a leadframe IC package, a leadframe modeler and an IC design system are disclosed. In one embodiment the method includes: (1) adding connectivity information to a geometric representation of a leadframe, wherein the connectivity information represents electrical connections between the IC die and leads of the leadframe and (2) formatting the leads to represent BGA point of contacts for the IC die.

Method of generating a leadframe IC package model, a leadframe modeler and an IC design system

Various systems and methods for implementing multi-mode semiconductor devices are discussed herein. For example, a multi-mode semiconductor device is disclosed that includes a device package with a number of package pins. In addition, the device includes a semiconductor die or substrate with at least two IO buffers. One of the IO buffers is located a distance from a package pin and another of the IO buffers is located another distance from the package pin. One of the IO buffers includes first bond pad electrically coupled to a circuit implementing a first interface type and a floating bond pad, and the other IO buffer includes a second bond pad electrically coupled to a circuit implementing a second interface type. In some cases, the floating bond pad is electrically coupled to the circuit implementing the second interface type via a conductive interconnect, and the floating bond pad is electrically coupled to the package pin.

Systems and methods for supporting a subset of multiple interface types in a semiconductor device

An integrated circuit device comprising a die having a top surface with a peripheral region and an interior region surrounded by the peripheral region. Bond pads are disposed in the peripheral region of the die. One or more internal buses are disposed in the interior region of the die. The one or more internal buses distribute power to internal node points of the die. One or more bond wires connect one or more peripheral bond pads with one or more internal buses.

Methods and apparatus for integrated circuit device power distribution via internal wire bonds

Various systems and methods for implementing multi-mode semiconductor devices are discussed herein. For example, a multi-mode semiconductor device is disclosed that includes a device package with a number of package pins. In addition, the device includes a semiconductor die with at least two IO buffers. One of the IO buffers is located a distance from a particular package pin and another of the IO buffers is located a greater distance from the particular package pin. The IO buffer located closest to the package pin includes first bond pad electrically coupled to a circuit implementing a first interface type and a first floating bond pad, and the other IO buffer includes a second bond pad electrically coupled to a circuit implementing a second interface type and a second floating bond pad. In some cases, the first floating bond pad is electrically coupled to the circuit implementing the second interface type via a metal layer wire, and the first floating bond pad is electrically coupled to the particular package pin.

Systems and methods for distributing I/O in a semiconductor device

A method of manufacturing an integrated circuit package such as a BGA package for use with an integrated circuit chip. The integrated circuit package has a substrate formed with a cavity that exposes a lower conductive level in the package so that connections between the integrated circuit chip and the lower conductive level may be formed to reduce the through holes formed in the substrate. As a result, additional signal line interconnections may be included in the substrate circuit package and/or the size of the integrated circuit chip may be decreased. Each of these may be implemented for enhanced electrical performance. The multiple wire bonding tiers in the substrate may also provide greater wire separation that eases wire bonding and subsequent encapsulation processes.

Method of manufacturing an integrated circuit package

An integrated circuit (IC) package includes an IC having at least one ESD protection circuit that provides protection against electrostatic discharge. The IC has a plurality of bond pads that are not coupled to the ESD protection circuit. The IC is connected to a substrate. The substrate has a first plurality of conductive traces, which are connected to respective bond pads of the IC, and a second plurality of conductive traces, which are not connected to any of the plurality of bond pads of the IC. Either the substrate or the IC has a common conductive trace that is connected to the ESD protection circuit. Each of the second plurality of conductive traces is connected to the common conductive trace.

Integrated circuit package with improved ESD protection for no-connect pins

An integrated circuit package such as a BGA package for use with an integrated circuit chip. The integrated circuit package has substrate with a cavity that exposes a lower conductive level in the package so that connections between the integrated circuit chip and the lower conductive level may be formed to reduce the through holes formed in the substrate. As a result, additional signal line interconnections may be included in the substrate circuit package and/or the size of the integrated circuit chip may be decreased. Each of these may be implemented for enhanced electrical performance. The multiple wire bonding tiers in the substrate may also provide greater wire separation that eases wire bonding and subsequent encapsulation processes.

Growing community of inventors

King of Prussia, PA, United States of America

Donald Earl Hawk, Jr