Alliedsignal Inc.

Industrial Measurement Systems, Inc.

Other

3m Innovative Properties Company

Donald E Yuhas

Jiri D Konicek

David P Groppi

Carol L Vorres

Roger Y Leung

Stephen T Gonczy

Patrick Schneider

Mark J Mutton

Keith H Foster

Don G Walker, Jr

James H Voth

Methods and apparatus for measuring heat flux in a material are disclosed. A disclosed example method involves emitting an acoustic signal into the material and determining a first propagation time associated with the propagation of the acoustic signal through the material. A first heat flux value indicative of a first heat flux of the material is then determined based on the first propagation time.

Methods and apparatus for measuring temperature and heat flux in a material using ultrasound

Apparatus, methods, and articles of manufacture for monitoring a condition of a material are disclosed. In particular, the example apparatus, methods, and articles of manufacture emit a first acoustic signal into a wall of the tubular member having a first temperature value and obtain a first propagation time associated with the first acoustic signal. In addition, a second acoustic signal is emitted into the wall having a second temperature value and a second propagation time associated with the second ultrasonic acoustic signal is obtained. The second temperature value is determined based on the first temperature value and the first and second propagation times.

Methods and apparatus for monitoring a condition of a material

Apparatus, methods, and articles of manufacture for monitoring a condition of a cavity surface of an elongated member having a cavity therein. In particular, the example apparatus, methods, and articles of manufacture emit a first ultrasonic signal that propagates from a first surface of an elongated member having a cavity therein toward a second surface of the cavity having a first temperature value. First and second echoes associated with the first ultrasonic signal are then obtained. At least one of the first and second echoes is associated with a recess in the second surface. A condition of the second surface is monitored by determining a second temperature value of the second surface based on the first and second echoes and the first temperature value.

The present invention is a method for determining the center to center spacing of conductors in an insulated, multi-conductor, flat cable. The method comprising applying an X-ray field to the cable, detecting the X-ray field intensity that passes through the cable, obtaining a digitized output waveform of the X-ray field intensity as a function of cable position, and determining a trough location of the waveform by averaging calculated position values for the center of the conductor at several longitudinal positions along a cross section of the conductor.

Advanced cable metrology system

A method for making multilayer laminates having at least one exposed layer of copper foil. The exposed layer of copper foil is covered with a adhesively attached protective metal sheet made of a copper prior to being laminated.

Copper foil laminate for protecting multilayer articles

Dimensionally stable laminates of epoxy resin reinforced with glass fibers have a coefficient of thermal expansion which matches that of copper, making possible copper foil covered laminates which provide improved registration in multilayer printed circuit boards. New glass fabric styles provide balanced thermal expansion in both the warp and fill directions.

System of electronic laminates with improved registration properties

A protective layer for polymeric composite substrates comprises a fiber-reinforced glass composite having a refractory fiber in a matrix of a black glass ceramic having the empirical formula SiCxOy where x ranges from about 0.5 to about 2.0, preferably 0.9 to 1.6 and y ranges from about 0.5 to 3.0, preferably 0.7 to 1.8. The black glass ceramic is derived from cyclosiloxane monomers containing a vinyl group attached to silicon and/or a hydride-silicon group.

Growing community of inventors

Glen Ellyn, IL, United States of America

Donald E Yuhas