Transtech Systems, Inc.

Donald D Colosimo

Sarah E Pluta

John W Hewitt

Systems and methods for measuring and monitoring physical properties of a material under test (MUT) from a vehicle, e.g., using complex electromagnetic impedance. Various embodiments include a method including: obtaining displacement data about a position of a sensor array relative to a material under test (MUT); comparing the displacement data with reference displacement data to determine whether the sensor array is at a reference distance relative to the MUT; in response to determining that the sensor array is located at the reference distance, instructing the sensor array to transmit a set of electromagnetic impedance signals into the MUT; obtaining a return electromagnetic impedance signal from the MUT; and calculating at least one physical property of the MUT based upon the transmitted set of electromagnetic impedance signals, the return electromagnetic impedance signals, and the displacement data.

Measurement and monitoring of physical properties of material under test (MUT) from a vehicle

Approaches include selecting a desired location for the measurement of electromagnetic spectroscopic impedance data for correlation with a physical property of a material under test (MUT) with electromagnetic impedance tomography. The MUT is first characterized tomographically with a series of four-terminal electrode patterns at a single current frequency. Measured and computed values of electromagnetic impedance for the voxels and sub-voxels of the MUT are determined. The sub-voxel with a targeted value of impedance is selected and matched with the specific four-terminal electrode pattern related to that sub-voxel. The spectrographic electromagnetic impedance measurements are made across a range of frequencies for the selected sub-voxel, using all of the four-terminal electrode patterns required to compute the tomographic impedance value of the selected sub-voxel. The computed spectrographic electromagnetic impedance value for the selected sub-voxel is then correlated to a physical property of the MUT.

Determining location of electromagnetic impedance spectrographic analysis using electromagnetic impedance tomography

A method of extracting complex impedance from selected volumes of the material under test (MUT) combined with various embodiments of electrode sensor arrays. Configurations of linear and planar electrode arrays provide measured data of complex impedance of selected volumes, or voxels, of the MUT, which then can be used to extract the impedance of selected sub-volumes or sub-voxels of the MUT through application of circuit theory. The complex impedance characteristics of the sub-voxels may be used to identify variations in the properties of the various sub-voxels of the MUT, or be correlated to physical properties of the MUT using electromagnetic impedance tomography and/or spectroscopy.

Selective characterization of material under test (MUT) with electromagnetic impedance tomography and spectroscopy

Methods of extracting complex impedance from selected subsurface volumes of a material under test (MUT) using various embodiments of electrode sensor pairs are provided. The electrode pairs can penetrate into a subsurface of the MUT, and operate below the surface of the MUT. Configurations of electrode pair sensors provide measured data of complex impedance of selected subsurface volumes of the MUT using electromagnetic spectrographic signals over a frequency range. The complex impedance characteristics of the subsurface volumes may be used to identify variations in the properties of the MUT, or be correlated to physical properties of the MUT.

Characterization of material under test (MUT) with electromagnetic impedance spectroscopy

Various embodiments include planar sensor arrays for use in determining characteristics of a material under test (MUT). The planar sensor arrays can include a set of electrodes positioned to enhance a depth and clarity of detection into the material under test. Some embodiments include an electromagnetic sensor array having: a first set of two rectilinear electrodes, positioned opposed to one another across a space; and a second set of two rectilinear electrodes, positioned opposed to one another across the space, the second set being off-set from the first set, wherein the first set and the second set are configured to detect an electromagnetic impedance of the MUT.

Planar sensor array for non-destructive evaluation of material using electromagnetic impedance

Various embodiments include solutions for in-process material characterization. Various particular embodiments include a computer-implemented method including: providing instructions for transmitting oscillating electromagnetic field signals to a material under test (MUT); obtaining a return signal associated with the transmitted oscillating electromagnetic field signals; comparing the return signal with the oscillating electromagnetic field signals to determine a difference in an aspect of the return signal and the aspect of the oscillating electromagnetic field signals; comparing the difference in the aspect to a predetermined threshold; and determining a characteristic of the MUT based upon the compared difference.

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Saratoga Springs, NY, United States of America

Donald D Colosimo