Advanced Micro Devices Corporation

Globalfoundries Inc.

Donald Craig Likes

Russell Clinton Brown

Carmen Adriana Maxim

Marwane Jawad Yazback

Noel Curtis Rives

Yurong Shi

David Alan Richardson

Jeffrey B Toth

Larry D Barto

Gerald L Goff

Robert Michael Russin

Richard Bruce Patty

Leslie Marshall

Barry R Hobbs

William A Norris

The present invention provides a communication infrastructure that allows application programs within a software system to dynamically use services, such as receiving and transmitting messages, through a common application program interface (API). The communication infrastructure allows the specific communication schemes that are being used to be isolated from the application programs such that the application programs are not dependent upon a particular communication scheme.

Communication scheme-independent infrastructure

A method includes transforming, based on a first transform, a first markup language document associated with a first version of a schema to generate a second markup language document associated with a second version of the schema. The second markup language document is representative of a third markup language document associated with the second version of the schema and the first transform represents a transform from the first version of the schema to the second version of the schema. The method further includes comparing the second markup language document to the third markup language document to identify whether at least one discrepancy exists between the second markup language document and the third markup language document. The method additionally includes determining a suitability of the first transform based on the comparison of the second markup language document to the third markup language document.

Method and system for schema version transform verification

A method for dispatching wafers for processing in a tool includes identifying a queue of wafers available to be processed in the tool. One of the wafers is randomly selected based at least in part on a length of time each wafer has been in the queue. The selected wafer is dispatched for processing in the tool.

Method and apparatus for randomizing dispatch order for single wafer processing

A semiconductor fabrication architecture which includes a middleware component, a fabrication facility coupled to the middleware component, a real time dispatcher application program interface coupled between the fabrication facility and the middleware component, a work in progress application program interface coupled between the fabrication facility and the middleware component, an enterprise resource planning system coupled to the middleware component, and an order processing system coupled to the middleware component. The fabrication facility includes a manufacturing execution system and a real time dispatch system. The manufacturing execution system tracks overall processing of semiconductor wafers. The real time dispatch system provides near real time information regarding processing of semiconductor wafers. The real time dispatcher application program interfaces publishing information to the middleware component. The work in progress application program interface provides an interface for communicating to the fabrication facility from the middleware component. The enterprise resource planning system subscribes to information published by the real time dispatcher application program interface. The order processing system receives orders from a customer and provides the order information to the enterprise resource planning system via the middleware component.

Web based semiconductor ordering architecture

A process, architecture, and computer program product for using the inheritance features of an object-oriented system to enable multiple programmers to modify different behaviors of an object concurrently. A first method and a second method to be performed on the object are identified. The first method is developed in a first application having a first subclass of the object's class. A first application-specific object is an instantiation of the first subclass. The second method is concurrently developed in a second application having a second subclass of the object's class. A second application-specific object is an instantiation of the second subclass. Invoking the first method performs the first method on the first application-specific object, such that the object communicates as if the first method were performed on the object. Modifying the first method does not affect the second method, and vice versa.

Use of inheritance to allow concurrent programming

An architecture for integrating data between a plurality of software applications in a factory environment comprises a factory system and a domain application. The factory system comprises a domain object superclass and at least two first-level subclasses of the domain object superclass. An instantiation of one of the first-level subclasses corresponds to a domain object, which represents an item in a factory. The factory system also includes a service, which provides an operation related to the domain object. The service comprises at least one component, where each component is operable to perform the operation related to the domain object. The architecture also includes a domain application, which implements a component of the service of the factory system to perform the operation related to the domain object. The architecture can optionally include a system manager for managing hardware and software in the factory.

System for integrating data between a plurality of software applications in a factory environment

In its various embodiments, the method collects data from process and metrology tools in a semiconductor manufacturing environment, generates statistics from that data, detects tool failures, processing errors, and other conditions that can jeopardize product output, and performs high level process control in the form of tool shutdowns, lot holds, and lot releases. One method as disclosed automates the collection and recording of data from process and metrology tools, automates configuration of data collection, and automates process equipment shut downs, all within the existing framework of existing MES systems and engineering data collection systems. Automation of configurations and data collection is conducted by creation of data collection plans, data collection capability specifications, and other versioned documents within a process control and data collection system as disclosed herein. These versioned documents may be generated through a common graphical user interface and presented via an Internet web browser or other network interface.

System and software for data collection and process control in semiconductor manufacturing and method thereof

An interface for a semiconductor fabrication facility which includes a real time dispatch system that provides near real time information regarding processing of semiconductor wafers and a middleware component. The interface includes a real time dispatcher application program interface coupled between the fabrication facility and the middleware component. The real time dispatcher application program interface provides a common interface which provides information to the middleware component.

Real time dispatcher application program interface

An integrated enterprise resource planning and manufacturing system which includes a middleware component, a fabrication facility coupled to the middleware component, a real time dispatcher application program interface coupled between the fabrication facility and the middleware component, a work in progress application program interface coupled between the fabrication facility and the middleware component, and an enterprise resource planning system coupled to the middleware component. The fabrication facility includes a manufacturing execution system and a real time dispatch system. The manufacturing execution system tracks overall processing of semiconductor wafers. The real time dispatch system provides near real time information regarding processing of semiconductor wafers. The real time dispatcher application program interfaces publishing information to the middleware component. The work in progress application program interface provides an interface for communicating to the fabrication facility from the middleware component. The enterprise resource planning system subscribes to information published by the real time dispatcher application program interface.

Integrated enterprise resource planning and manufacturing system

An interface for a semiconductor fabrication facility which includes a real time dispatch system providing near real time information regarding processing of semiconductor wafers and a middleware component. The interface includes a work in progress application program interface coupled between the fabrication facility and the middleware component. The work in progress application program interface provides a common interface for communicating between the fabrication facility and the middleware component.

Work in progress management program interface

A semiconductor fabrication facility architecture which includes a fabrication facility, a middleware component, a real time dispatcher application program interface coupled between the fabrication facility and the middleware component, and a work in progress application program interface coupled between the fabrication facility and the middleware component. The fabrication facility includes a manufacturing execution system and a real time dispatch system. The manufacturing execution system tracks overall processing of semiconductor wafers and the real time dispatch system provides near real time information regarding processing of semiconductor wafers. The real time dispatcher application program interface provides a common interface for providing information to the middleware component. The work in progress application program interface provides a common interface for communicating to the fabrication facility from the middleware component.

Fabrication architecture including enterprise resource planning integration

A method is presented wherein an engineering data collection (EDC) subsystem of a process control system as embodied is responsible for configuring data collection, distributing collected data, and storing collected data, and is supported through underlying interfaces in a transaction and performance monitoring system. In an embodiment, an engineering data collection (EDC) broker accepts data from equipment interfaces or a tap subsystem, then distributes the data to all subscribers such as data history, the engineering data analysis (EDA) system interface, and the statistical process control (SPC) subsystem as disclosed herein. Engineering data analysis system interface is responsible for transmitting raw data and process control system data to engineering data analysis system. Data history subscribes to all data and stores it in the transaction and performance monitoring system's online transaction processing (OLTP) database. User input to engineering data collection subsystem is accomplished via web interface or a keyboard data entry client.

System and software for data distribution in semiconductor manufacturing and method thereof

A messaging system includes a message bus and a first processing device. The message bus is adapted to transmit a first message. The first message includes a second message, and the second message includes at least a first command. The first processing device is coupled to the message bus. The first processing device includes a message interface adapted to receive the first message and extract the second message independent of the first command. An input queue is adapted to store the second message. A message interpreter is adapted to retrieve the second message from the message queue and decode the second message to identify the first command. A method for communicating messages includes transmitting a first message over a message bus. The first message includes a second message, and the second message includes at least a first command. The first message is received and the second message is extracted independent of the first command. The second message is stored in an input queue. The second message is retrieved from the message queue. The second message is decoded to identify the first command.

Messaging system with protocol independent message format

A system and method for providing inter-tier application control in a multi-tiered computer computing environment. In an example embodiment for a multi-tier computing environment that includes a first tier application program, a second tier application program, and a plurality of third tier control elements, connection identifiers that respectively reference connections between the second tier application program and the third tier control elements are associated with respective third tier control element identifiers. When the second tier application program receives a message from the first tier application program, mapping software indicates to the second tier application program a third tier control element identifier based on the message. A control message generated by the second tier application program is transmitted to a third tier control element based on the indicated third tier control element identifier and the associated connection.

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Austin, TX, United States of America

Donald Craig Likes