Semiconductor Components Industries, LLC

Sandia Corporation

University of Wyoming

On Semiconductor

Donald Claude Thelen, Jr

Michael J Wilcox

David F Cox

Dahlon D Chu

Steven F Barrett

David V Campbell

Marc L Keppler

In one embodiment, a semiconductor device may include forming a first inverter and a second inverter to selectively receive separate inputs of a differential input signal and directly connecting each of the first and second inverters to receive power directly from a voltage input and a voltage return. The first inverter may be configured to include a first control switch that is configured to selectively couple together an upper transistor and a lower transistor of the first inverter. The second inverter may be configured to include a second control switch that is configured to selectively couple together an upper transistor and a lower transistor of the second inverter.

Method of forming a semiconductor device and structure therefor

In one embodiment, an amplifier is configured to include a pre-drive circuit that forms an estimated value of an output signal of the amplifier and forces the output to the estimated value before the amplifier forms the output signal.

Method of forming an amplifier and structure therefor

An apparatus and method for providing image primitives, such as edge polarity, edge magnitude, edge orientation, and edge displacement, and derivatives thereof, for an object are described. The data are obtained substantially simultaneously and processed in parallel such that multiple objects can be distinguished from one another in real time.

Cooperative optical-imaging sensor array

The management of unit element selections in a system that includes multiple unit elements. The system includes an element selection component that is configured so that each of the multiple elements is used the same number of times over a certain number of selection cycles. This preserves the first order noise shaping of the mismatch noise thereby keeping a high signal to noise ratio. In addition, the selection of the unit elements is not done in a periodic fashion. This allows the system to avoid tones within the signal band.

System unit element selection

A digital feedback control circuit is disclosed for use in an accelerometer (e.g. a microelectromechanical accelerometer). The digital feedback control circuit, which periodically re-centers a proof mass in response to a sensed acceleration, is based on a sigma-delta (&Sgr;&Dgr;) configuration that includes a notch filter (e.g. a digital switched-capacitor filter) for rejecting signals due to mechanical resonances of the proof mass and further includes a comparator (e.g. a three-level comparator). The comparator generates one of three possible feedback states, with two of the feedback states acting to re-center the proof mass when that is needed, and with a third feedback state being an &ldquo;idle&rdquo; state which does not act to move the proof mass when no re-centering is needed. Additionally, the digital feedback control system includes an auto-zero trim capability for calibration of the accelerometer for accurate sensing of acceleration. The digital feedback control circuit can be fabricated using complementary metal-oxide semiconductor (CMOS) technology, bi-CMOS technology or bipolar technology and used in single- and dual-proof-mass accelerometers.

Microelectromechanical accelerometer with resonance-cancelling control circuit including an idle state

A sensor readout detector circuit is disclosed that is capable of detecting sensor signals down to a few nanoamperes or less in a high (microampere) background noise level. The circuit operates at a very low standby power level and is triggerable by a sensor event signal that is above a predetermined threshold level. A plurality of sensor readout detector circuits can be formed on a substrate as an integrated circuit (IC). These circuits can operate to process data from an array of sensors in parallel, with only data from active sensors being processed for digitization and analysis. This allows the IC to operate at a low power level with a high data throughput for the active sensors. The circuit may be used with many different types of sensors, including photodetectors, capacitance sensors, chemically-sensitive sensors or combinations thereof to provide a capability for recording transient events or for recording data for a predetermined period of time following an event trigger. The sensor readout detector circuit has applications for portable or satellite-based sensor systems.

Growing community of inventors

Bozeman, MT, United States of America

Donald Claude Thelen, Jr