Johns Hopkins University

Donald A Ruffle

William C Walton

Christopher M Gifford

Marc A Kolodner

A detection system includes processing circuitry configured to receive overhead image data divided into a plurality of image chips and receive metadata associated with the image data. The metadata includes ground sample distance information associated with the image data and provides an indication of ground area represented by each pixel within the image chips. The processing circuitry is further configured to screen the image chips for candidate detections based on a multi-stage screening process and determine whether to classify candidate detections as target detections. The process includes an intensity based screening stage, an object extraction stage that employs binary shape features to extract objects from detect positions identified based on an output of the intensity based screening stage, and a candidate detection identification stage employing template based and structural feature criteria to identify candidate detections from an output of the object extraction stage.

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Ellicott City, MD, United States of America

Donald A Ruffle