Interconnect Devices, Inc.

Hypertronics Corporation

Smiths Interconnect Americas, Inc.

Donald A Marx

David W Henry

Timothy E Marshall

Francesco A Nania

David E Salomon

Jason W Farris

Joseph J Caven

William E Thurston

Eric L Bogatin

A configurable and modular probe device for electrical connections. The probe device has multiple blocks capable of inter-fitting into various layouts. Each block has four sidewalls. Two adjacent sidewalls have a protrusion and the respective opposite sidewalls have a cavity corresponding to the protrusion. The protrusion of one block can removably mate with the cavity of a neighboring block. Each block further has a central cavity extending from a top surface to a bottom surface of the block. A probe snugly fits into the central cavity.

Series connector

A connector includes a receptacle having a body defining apertures and having a mating face and socket contacts each defining an opening aligned with an aperture. The connector also includes a plug having an outer casing defining a cavity and having a mating end and contacts positioned within the cavity and coupled to the outer casing, each having a pin tip. The plug also includes a pin protection plate slidably coupled to the outer casing, enclosing at least a portion of each contact within the cavity, and defining pin guides each aligned with one of the contacts. When the mating end is aligned with the mating face and force is applied to the outer casing towards the body, the pin protection plate slides into the cavity and the pin tip of the contacts extends beyond the pin protection plate into a socket contact via one of the apertures.

Connectors

Connector

An adjustable test socket for aligning an electronic device with spring probes in a test fixture is provided having two adjustable walls or four adjustable walls.

Adjustable test socket

A probe array wafer includes a substrate upon which a plurality of compliant probes are mounted. Pairs of axially aligned probes may be electrically connected together to provide a pass through power connection from the test equipment to the device under test. Likewise, pairs of axially aligned probes may be electrically connected together to provide a ground connection from the test equipment to the device under test.

Probe array wafer

A contact spring probe includes a plunger and a spring with a pair of opposed closed coils separated by an open coil. The plunger is secured at one end to one set of closed coils with a shoulder, flange or barb extending from the body of the plunger.

Growing community of inventors

Olathe, KS, United States of America

Donald A Marx