Jentek Sensors, Incorporated

Don Straney

Neil J Goldfine

Scott A Denenberg

Yanko K Sheiretov

Andrew P Washabaugh

Todd M Dunford

Leon B Kristal

Brian L Manning

Brian Manning

System and method for characterizing material condition. The system includes a sensor, impedance instrument and processing unit to collect measurements and assess material properties. A model of the system may be used to enable accurate measurements of multiple material properties. A cylindrical model for an electromagnetic field sensor is disclosed for modeling substantially cylindrically symmetric material systems. Sensor designs and data processing approaches are provided to focus the sensitivity of the sensor to localize material conditions. Improved calibration methods are shown. Sizing algorithms are provided to estimate the size of defects such as cracks and corrosion. Corrective measures are provided where the actual material configuration differs from the data processing assumptions. Methods are provided for use of the system to characterize material condition, and detailed illustration is given for corrosion, stress, weld, heat treat, and mechanical damage assessment.

Method and apparatus for measurement of material condition

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Cambridge, MA, United States of America

Don Straney