California Micro Devices Corp.

Semiconductor Components Industries, LLC

Dominick L Richiuso

Adam J Whitworth

Jeffrey C Kalb, Jr

Jeffrey C Kalb

John C Jorgensen

Rong Liu

William N Buchele

John M Jorgensen

Anguel Svilenov Brankov

A method for implementing an inductor-capacitor filter in an integrated circuit. Embodiments of the invention implement a 5-pole LC low-pass filter suitable for incorporation in wireless applications necessitating compact layouts. Inductors are formed in an IC as concentric coils on metallization layers, the concentric coils providing a negative coupling coefficient between the inductors. The invention provides programmable frequency response characteristics, enabling the transmission of high-frequency base band information while attenuating carrier RF frequencies.

Integrated passive filter incorporating inductors and ESD protectors

A method for endowing an integrated passive device array structure with a programmable value during manufacturing. The method includes forming a substantially conductive first layer and forming a plurality of passive device array elements of the integrated passive device array structure above the substantially conductive first layer. The method further includes forming an insulating layer above the plurality of passive device array elements. There is further included selectively forming vais the insulating layer. The vias facilitate electrical connections between selected ones of the plurality of passive device array elements with a substantially conductive second layer subsequently deposited above the insulating layer.

Method for programmable integrated passive devices

An active termination circuit for clamping a signal on a transmission line in an electronic device is described. The active termination circuit is configured to clamp the signal on the transmission line to one of a first reference voltage level and a second reference voltage level. In one embodiment, the active termination circuit includes a bottom clamping transistor coupled to a first potential having a bottom clamping transistor control node arranged for clamping the signal at about a first reference voltage. The active termination circuit also includes a top clamping transistor coupled to a second potential having a top clamping transistor control node arranged for clamping the signal at about a second reference voltage as well as stabilizing capacitors for stabilizing control node voltages.

Termination circuits and methods therefor

An active termination circuit having a selective DC power consumption for clamping signals on a bus in an electronic device is described. The active termination circuit is configured to clamp the signals on the bus to one of a first reference voltage level and a second reference voltage level. In one embodiment, the active termination circuit includes bottom clamping transistors coupled to a first potential having bottom clamping transistor control nodes arranged for clamping the signal at about a first reference voltage. The active termination circuit also includes top clamping transistors coupled to a second potential having top clamping transistor control nodes arranged for clamping the signal at about a second reference voltage. The circuit also has a variable current supply coupled to said first threshold reference transistor and said second threshold reference transistor arranged to reduce the DC power consumption of the active termination circuit as needed.

An active termination circuit for clamping signals on a bus in an electronic device is described. The active termination circuit is configured to clamp the signals on the bus to one of a first reference voltage level and a second reference voltage level. In one embodiment, the active termination circuit includes bottom clamping transistors coupled to a first potential having bottom clamping transistor control nodes arranged for clamping the signal at about a first reference voltage. The active termination circuit also includes top clamping transistors coupled to a second potential having top clamping transistor control nodes arranged for clamping the signal at about a second reference voltage.

An active termination circuit having localized potential supplies for clamping a signal on a transmission line in an electronic device is described. The active termination circuit is configured to clamp the signal on the transmission line to one of a first reference voltage level and a second reference voltage level. In one embodiment, the active termination circuit includes a bottom clamping transistor coupled to a first localized potential having a bottom clamping transistor control node arranged for clamping the signal at about a first reference voltage. The active termination circuit also includes a top clamping transistor coupled to a second localized potential having a top clamping transistor control node arranged for clamping the signal at about a second reference voltage. Any voltage excursions at the first localized potential does not affect the first localized reference voltage, and vice versa and any voltage excursions at the second localized potential does not affect the second localized reference voltage, and vice versa.

An active termination circuit for clamping a signal on a transmission line in an electronic device is described. The active termination circuit is configured to clamp the signal on the transmission line to one of a first reference voltage level and a second reference voltage level. In one embodiment, the active termination circuit includes a bottom clamping transistor coupled to a first potential having a bottom clamping transistor control node arranged for clamping the signal at about a first reference voltage. The active termination circuit also includes a top clamping transistor coupled to a second potential having a top clamping transistor control node arranged for clamping the signal at about a second reference voltage.

An active termination circuit for clamping a signal on a transmission line in an electronic device in a tri-state mode is described. The active circuit includes a tri-state output buffer and a bottom clamping transistor coupled to GND and the tri-state output buffer having a bottom clamping transistor control node arranged for clamping the signal at about GND. A bottom threshold reference transistor coupled to a first reference voltage supply configured to supply a first reference voltage. The bottom threshold reference transistor provides a first bias voltage to the bottom clamping transistor control node that biases the bottom clamping transistor control node at about a first threshold voltage above GND where the first threshold voltage represents a threshold voltage of the bottom clamping transistor. A top clamping transistor coupled to VDD and the tri-state output buffer having a top clamping transistor control node arranged for clamping said signal at about VDD and a top threshold reference transistor coupled to a second reference voltage supply configured to supply a second reference voltage. The top threshold reference transistor provides a second bias voltage to the top clamping transistor control node that biases the top clamping transistor control node at about a second threshold voltage from VDD where the second threshold voltage represents a top clamping transistor threshold voltage.

An active termination circuit for protecting a node against an ESD voltage spike is described. The ESD protection circuit includes a bottom ESD protection transistor having a first node coupled to a first potential and a bottom ESD protection transistor intrinsic diode reverse biasedly coupling said node to a first reference voltage supply and a bottom threshold reference transistor coupled to the first reference voltage supply. The bottom threshold reference transistor provides a first bias voltage to the bottom ESD protection transistor gate that biases the bottom clamping transistor gate at about a first threshold voltage from the first reference voltage representing a threshold voltage of said bottom ESD protection transistor. The circuit also includes a top ESD protection transistor having a second node coupled to a second potential and a top ESD protection transistor intrinsic diode reverse biasedly coupling the node to a second reference voltage supply and a top threshold reference transistor coupled to the second reference voltage supply. The top threshold reference transistor provides a second bias voltage to the top ESD protection transistor gate that biases the top clamping transistor gate at about a second threshold voltage below the second reference voltage that represents a threshold voltage of said top ESD protection transistor.

An active termination circuit for terminating a transmission line in bused or networked device, which might include a plurality of devices. The active termination circuit is configured to clamp a voltage level on the transmission line to one of a first reference voltage level and a second reference voltage level. The active termination circuit includes a first clamping transistor coupled to a transmission line terminal and a first terminal. The transmission line terminal is configured to be coupled to the transmission line in the electronic device. The first terminal is configured to be coupled to the first reference voltage level in the electronic device. There is included a second clamping transistor coupled to the transmission line terminal and a second terminal. The second terminal is configured to be coupled to the second reference voltage level in the electronic device. There is also included a first threshold reference device coupled to the first clamping transistor. The first threshold reference device being configured to maintain a base of the first clamping transistor at about V,lower than the second reference voltage level. There is further included a second threshold reference device coupled to the second clamping transistor, the second threshold reference device being configured to maintain a base of the second clamping transistor at about V,higher than the first reference voltage level.

Termination circuits and methods for bused and networked devices

An integrated passive device array structure with a value that is programmable during manufacturing. The device structure includes a substantially conductive first layer having a plurality of passive device array elements of the integrated passive device array structure disposed above the substantially conductive first layer. The device further includes an insulating layer formed above the plurality of passive device array elements. One or more vias are selectively formed in the insulating layer. The vias facilitate electrical connections between selected ones of the plurality of passive device array elements with a substantially conductive second layer subsequently deposited above the insulating layer.

Programmable integrated passive devices

An integrated electrical overload protection device and method of formation which functions as a thermal fuse. The device is integrated directly on the underlying structural or foundational material of an electrical circuit which experiences the electrical overstress. The device can be formed according to standard semiconductor process steps when formed on a semiconductor substrate. The device, or fuse, includes a first and second contact area separated by a gap area. A least a portion of the upper surfaces of the contact areas are covered with a wettable material such as gold. A solder bump, or bridge, is applied which spans the contact areas and provides an closed electrical connection. Upon application of an overload condition across the bridge material, a rise in temperature causes the solder material to melt. The solder flows onto the wettable areas and is drawn out of the gap area to thereby disrupt the electrical connection between the contact areas. The contacts areas, gap, and solder material can be varied to provide fuses with different characteristics.

Integrated electrical overload protection device and method of formation

An active termination circuit for terminating a transmission line in memory bus, which might include a plurality of devices. The active termination circuit is configured to clamp a voltage level on the transmission line to one of a first reference voltage level and a second reference voltage level. The active termination circuit includes a first clamping transistor coupled to a transmission line terminal and a first terminal. The transmission line terminal is configured to be coupled to the transmission line in the electronic device. The first terminal is configured to be coupled to the first reference voltage level in the electronic device. There is included a second clamping transistor coupled to the transmission line terminal and a second terminal. The second terminal is configured to be coupled to the second reference voltage level in the electronic device. There is also included a first threshold reference device coupled to the first clamping transistor. The first threshold reference device being configured to maintain a base of the first clamping transistor at about V.sub.BE lower than the second reference voltage level. There is further included a second threshold reference device coupled to the second clamping transistor, the second threshold reference device being configured to maintain a base of the second clamping transistor at about V.sub.BE higher than the first reference voltage level.

Termination circuits and methods for memory buses and devices

An active termination circuit for terminating a transmission line in an electronic device. The active termination circuit is configured to clamp a voltage level on the transmission line to one of a first reference voltage level and a second reference voltage level. The active termination circuit includes a first clamping transistor coupled to a transmission line terminal and a first terminal. The transmission line terminal is configured to be coupled to the transmission line in the electronic device. The first terminal is configured to be coupled to the first reference voltage level in the electronic device. There is included a second clamping transistor coupled to the transmission line terminal and a second terminal. The second terminal is configured to be coupled to the second reference voltage level in the electronic device. There is also included a first threshold reference device coupled to the first clamping transistor. The first threshold reference device being configured to maintain a base of the first clamping transistor at about V.sub.BE lower than the second reference voltage level. There is further included a second threshold reference device coupled to the second clamping transistor, the second threshold reference device being configured to maintain a base of the second clamping transistor at about V.sub.BE higher than the first reference voltage level.

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Saratoga, CA, United States of America

Dominick L Richiuso