Samsung Electronics Co., Ltd.

Dojeon Lee

Jin-Young Kim

Jin-Yub Lee

Yohan Lee

Won-Tae Kim

Venkataramana Gangasani

Sungwhan Seo

Kichang Jang

Dueung Kim

Junehong Park

A semiconductor device includes a first voltage generating circuit configured to output a first voltage based on temperature; an analog-to-digital converter configured to convert the first voltage into a temperature code; a code conversion logic configured to output an offset code and a level code of a temperature section which the temperature belongs among temperature sections based on the temperature code; an offset voltage generating circuit configured to output an offset voltage based on the offset code; a second voltage generating circuit configured to output a second voltage having a constant value within a temperature section based on the level code; and a temperature compensation voltage generating circuit configured to receive the first voltage, the second voltage, the offset voltage, and a feedback voltage and output a temperature compensation voltage, the feedback voltage based on the first voltage, the second voltage, and the offset voltage.

Semiconductor device

A memory device includes a bay comprises a plurality of word lines, a plurality of bit lines, and a memory cell connected to a first word line of the plurality of word lines and a first bit line of the plurality of bit lines, a row decoder configured to bias at least one word line of the word lines adjacent to the first word line and float remaining non-adjacent word lines of the plurality of word lines not adjacent to the first word line, in an access operation associated with the memory cell, and a column decoder configured to bias at least one bit line of the bit lines adjacent to the first bit line and float remaining non-adjacent bit lines of the plurality of bit lines not adjacent to the first bit line, in the access operation.

Memory device for controlling unselected memory cells in accordance with adjacency to selected memory cell, and method for operating the same

A nonvolatile memory device includes a voltage generating circuit configured to generate voltages applied to word lines corresponding to a selected memory block among memory blocks. The voltage generating circuit includes voltage source lines having linear voltages, a first voltage generating unit configured to generate a first voltage and apply the generated first voltage to a first voltage source line among the voltage source lines, a second voltage generating unit configured to generate a second voltage and apply the generated second voltage to a second voltage source line among the voltage source lines, and a linear voltage generator having a resistor string connected between the first voltage source line and the second voltage source line. At least one of the voltage source lines has a voltage distributed between the first voltage and the second voltage.

Nonvolatile memory device, storage device having the same, operating method thereof

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Hwaseong-si, South Korea

Dojeon Lee