Samsung Electronics Co., Ltd.

Do Hoon Byun

Jae Ho Lee

Jae Seung Choi

Yeon Ho Jung

Jong Wook Kye

Kwan Seong Lee

Chan Wook Park

Min Woo Kwak

Mi Joung Kim

Hwang Ho Choi

Je Kyun Ryu

An integrated circuit and an electronic device including the integrated circuit are provided. An integrated circuit includes a sequential logic circuit, which includes a first scan cell that is configured to receive a scan input, and a plurality of scan cells sequentially connected in series from the first scan cell, a control unit, which is configured to receive a selection signal including an output of each of the plurality of scan cells, and is further configured to output a control signal responsive to the selection signal, and a monitoring circuit, which is configured to receive the control signal, is configured to perform first monitoring of first data at a first node that is an observation node in the sequential logic circuit responsive to the control signal, and is configured to output a result of the first monitoring to a monitoring node.

Integrated circuit and an electronic device including integrated circuit

A semiconductor chip includes a semiconductor device connected between a first node to which a power supply voltage is applied and a second node to which a ground voltage is applied, a first ring oscillator connected to the first node through a first supply switch and the second node through a first ground switch and a second ring oscillator connected to the first node through a second supply switch and the second node through a second ground switch, wherein the first supply and ground switches are configured to operate in response to a first control signal, thereby operating the first ring oscillator, and the second supply and ground switches are configured to operate in response to a second control signal, thereby operating the second ring oscillator.

Semiconductor chip and test method of the same

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Hwaseong-si, South Korea

Do Hoon Byun