Freescale Semiconductor,inc.

Dmitry S Shipitsin

Margaret Leslie Kniffin

Michael J Zunino

In general, various embodiments of the present invention relate to systems and methods for simulating distributed effects by providing a meshing pattern () (e.g., a two-dimensional meshing pattern that is part of a recognition layer), applying that meshing pattern to the physical layout (), and partitioning the physical layout into a three-dimensional netlist () of components derived from the unit cells defined by the meshing pattern (), thereby modeling the parasitics within the design.

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Moscow, Russia

Dmitry S Shipitsin