Other

E.i. Dupont De Nemours and Company

Dupont Displays Inc

Dmitry Kolosov

Johann T Trujillo

Che-Hsiung Hsu

Ed Sundaram Ramakrishnan

Andrew Wesley Johnson

Ian David Parker

Charles D Lang

Ameen K Saafir

Lingling Wu

John Penczek

An electronic device can include an organic diode and a shunt that allows a significant current to bypass the organic diode, wherein the shunt is separate from the organic diode. Alternatively, an electronic device can include an organic diode lying along a first conduction path. The electronic device can also include a resistive member lying along a second conduction path that is parallel to the first conduction path. In another aspect, a process of forming an electronic device can include forming a first conductive member, forming a resistive member over the first conductive member, and forming an organic semiconductor layer over the first conductive member. The process can also include forming a second conductive member over the resistive member and the organic semiconductor layer, such that the resistive member and the organic semiconductor layer lie along parallel conduction paths between the first and second conductive members.

Electronic device including an organic diode and a shunt and a process of forming the same

A process of forming an electronic device is disclosed. An organic device layer is formed. The organic device layer includes a charge-selective material and a radiation sensitizer and has a first electrical conductivity and a first surface energy. First portions of the organic device layer are selectively exposed to radiation. The electrical conductivity and surface energy of the first portions of the organic device layer are modified.

Process for forming an organic electronic device including an organic device layer

Compositions comprising at least one conductive polymer and an organic cation are provided, and methods for making the same.

Method for ameliorating the wide column gap defect in organic electronic devices

Organic conductive compositions and structures

Defects are detected in organic electronic device displays such as organic light emitting diode (OLED) displays. An infrared camera may be used to screen displays for defects and to identify the locations of the defects. Relative hot or cold areas in a display correspond to defects and can be detected using the infrared camera.

Organic electronic device display defect detection

Growing community of inventors

Goleta, CA, United States of America

Dmitry Kolosov