Vaas International Holdings, Inc.

Dinh Tien Son

Methods and systems for collecting high definition images of spent firearm cartridges under different illumination conditions described herein. Features indicative of firing pin impact with each spent firearm cartridge are extracted and compared to features extracted from different spent firearm cartridges. The likelihood that the cartridges were fired from the same firearm is determined based on the differences between the extracted features. A cartridge fixture locates a spent firearm cartridge inside an imaging chamber illuminated by different combinations of illumination devices located in different locations with respect to the spent firearm cartridge. Collected images are filtered by a trained image feature filter to extract features indicative of a firing pin strike. Features extracted from different spent firearm cartridges are compared to determine the likelihood that the spent firearm cartridges were fired from the same firearm based on one or more error metrics characterizing feature differences.

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Tphcm, Vietnam

Dinh Tien Son