Boe Technology Group Co., Ltd.

Hefei Boe Optoelectronics Technology Co., Ltd.

Dingyuan Li

Jie Wang

Ruwang Guo

Haifeng Chen

An aperture measuring device and aperture measuring method for measuring the size of the aperture of a through-hole in a conductive structure is described to reduce the aperture measurement time and improve the working efficiency. The aperture measuring device includes: an aperture testing component for being inserted into the through-hole, wherein the aperture measuring device includes a plurality of resistor segments with different diameters, the individual resistor segments being successively connected in series in an order of the sizes of their diameters; and a measuring module for measuring the resistance value of a resistor segment unable to be inserted into the through-hole in the aperture testing component to determine the size of the aperture of the through-hole.

Growing community of inventors

Beijing, China

Dingyuan Li