Advanced Micro Devices Corporation

Mediatek Singapore Pte. Ltd.

Dimitry Patent

Shawn Searles

Eric W Mahurin

Ravinder Reddy Rachala

Joseph Patrick Geisler

Kin Hooi Dia

Matthew Cooke

Lena Ahlen

A scan test circuit includes: a functional path, including: a D-type latch, for receiving an input and generating an output, the D-type latch including a feedback node; and a test path, including: a scan latch, for receiving a test input and generating an output. The scan test circuit also includes a tri-state inverter. The output of the test path is input to the feedback node of the D-type latch and also input to the tri-state inverter. The functional path is clocked by pulses generated by a pulse generator according to a system clock. The test path is clocked by a test clock generated according to a test enable signal and the system clock. When the test enable signal is enabled, the generation of the pulses is disabled.

Scan test circuit with scan clock

An electronic circuit. The electronic circuit includes a first circuit leg coupled to a first supply voltage node and a second supply voltage node. The first circuit leg includes a first reference current circuit configured to produce a first reference current and a second reference current circuit configured to produce a second reference current. The electronic circuit further includes a second circuit leg coupled in parallel with the first circuit leg. The second circuit leg includes a first transistor coupled to form a current mirror with the first reference current circuit and a second transistor coupled to form a current mirror with the second reference current circuit. The source terminals of each of the first and second transistors are coupled together to form a third supply voltage node.

Voltage source for gate oxide protection

A circuit for a parity tree is disclosed. In one embodiment, a circuit for a parity tree includes a pull-up circuit, a pull-down circuit, and a cross-couple circuit. The circuit, an XOR/XNOR circuit, includes both an output node and an inverted output node. For a given set of input signals, a pull-up path exists through the cross-couple circuit for one of the output node and the inverted output node, and wherein a pull-down path exists through the cross-couple circuit for the other one of the output node and the inverted output node.

Circuit for parity tree structure

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Austin, TX, United States of America

Dimitry Patent