General Inspection, LLC

Dikshant Sharma

Nathan Kujacznski

Greg Nygaard

An inspection system includes a base, an array of fixtures, and a plurality of sensors or light sources. Each fixture has a first portion rotatably secured to the base and configured to rotate about a yaw axis and a second portion rotatably secured to the first portion and configured to rotate about a pitch axis. Each sensor or light source is secured to one of the fixtures and is configured to direct light at yaw and pitch angles relative to the base.

Inspection system for manufactured components

An inspection system includes a base plate, an array of fixtures, a plurality of light sources, and a drive mechanism. Each fixture has a first portion rotatably secured to the base plate and configured to rotate about a yaw axis and a second portion rotatably secured to the first portion and configured to rotate about a pitch axis. Each light source is secured to one of the fixtures and is configured to direct light at yaw and pitch angles relative to the base plate. The drive mechanism is configured to rotate the first portions of each fixture about each respective yaw axis and to rotate the second portions of each fixture about each respective pitch axis to adjust yaw and pitch angles of each light source, respectively.

Growing community of inventors

Troy, MI, United States of America

Dikshant Sharma