Sigma-aldrich Gmbh

Fluka Gmbh

Bam Bundesanstalf Fuer Materialforschung Und - Pruefung

Bam Bundesanstalf Fur Materialforschung Und - Prufung

Bam Bundesanstalt Fur Materialforschung Und-pruefung

Bam Bundesanstalt Fur Materialforschung Und-prufung

Bundesanstalt Fur Materialforschung Und -prufung (bam)

Dietmar Pfeifer

Ute Resch-Genger

Katrin Hoffmann

Pierre Nording

Knut Rurack

Christian Monte

Angelika Hoffmann

Bernhard Schönenberger

Monika Spieles

Roland Nitschke

A calibration system characterizes luminescence measurement systems, in particular spectrally resolving, wide-field and/or confocal imaging systems. The calibration system has a baseplate with at least one flow-through channel, wherein the at least one channel is formed as a sample chamber for the luminescence measurement system, at least one reservoir in communication with the at least one channel and adapted to receive a liquid, and at least one focusing device integrated into a baseplate for setting a defined measurement beam focus of the luminescence measurement system to be calibrated by using a focusing surface.

Calibration system and dye kit and their uses for characterizing luminescence measurement systems

The invention is directed to a method and a kit for calibrating a photoluminescence measurement system, in particular a fluorescence measurement system. The kit includes a number of fluorescence standards i and their corrected and certified fluorescence spectra I(&#x3bb;), whereby the fluorescence standards i are selected, so that their spectrally corrected fluorescence spectra I(&#x3bb;) cover a broad spectral range with high intensity. The standards are characterized by large half-widths FWHMof their bands of at least 1400 cm. According to the method of the invention, partial correction functions F(&#x3bb;) are generated by forming the quotient of the measured fluorescence spectra J(&#x3bb;) and the corresponding corrected fluorescence spectra I(&#x3bb;), which are then combined to form a total correction function F(&#x3bb;) for a broad spectral range. The combination factors &#x3b1;are hereby computed by statistical averaging of consecutive partial correction functions F(&#x3bb;) over only a predefined, limited overlap region &#x3bb;&#xb1;&#x394;&#x3bb;about the mutual crossover wavelength &#x3bb;.

Method and kit for calibrating a photoluminescence measurement system

Method and kit for calibrating a photoluminescence measurement

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Berlin, Germany

Dietmar Pfeifer