Carl Zeiss Jena Gmbh

Schott Glaswerke

F. Hoffmann-la Roche Ag

Carl Zeiss Microimaging Gmbh

Dieter Graefe

Hans-Juergen Dobschal

Peter Westphal

Ralf Wolleschensky

Frank-Thomas Lentes

Daniel Bublitz

Matthias Wald

Christof Fattinger

Michael Goelles

Martin Heming

Burkhard Danielzik

Martin Kuehner

Reinhard Steiner

Werner Fuchs

Guenter Gauglitz

Tobias Neumann

Guenter Berthel

Wolfgang Grau

Gunther Elender

Andreas Brecht

The invention refers to a process for determining the focus position when imaging a specimen () with a field stop imaged onto the specimen detecting this image using a position-sensitive receiving-device inclined relative to the field stop defining the focus position by means of intensity distribution in the receiving device. The invention also refers to set-ups as regards implementation of the process according to the invention. According to the invention, in a process of the above-mentioned type, imaging of the field stop onto the specimen () is at least partially superposed by an optical lattice; the position-sensitive receiving device is used to determine intensity values for the light reflected by the specimen; these intensity values are assigned to positions in the receiving device; position-related contrast values are determined from the position-related intensity values; the position of the contrast focus in the receiving device as equivalent of the current focus position is determined using these contrast values.

Method for determining the focal position during imaging of a sample using an inclined position receiving device

To provide an illumination beam () which is essentially homogeneous in cross-section, in particular for a laser scanning microscope (), an illumination device is used which provides an original beam which is essentially rotationally symmetric in cross-section and is incident at a converting unit which then transmits the desired illumination beam () and which comprises, for this purpose, an aspherical, convex mirror () which is more strongly curved in the area of the point of incidence of the original beam () than in the areas removed from the point of incidence.

Illumination device and its use

Emboidments are presented to improve spatial resolution or sensitivity in measuring fluorescent layers, including an embodiment wherein a specimen slide is provided which is not fluorescent by itself, is plate-shaped and has at least one plate side provided with fluorescent light absorbing properties, or with an antireflection-coating for fluorescent radiation.

Specimen slides and methods and uses thereof

An arrangement for the detection of biomolecular reactions and interactions using the RS screening method and comprises a specimen plate or microtiter plate (PP or MTP), a white light source with subsequently arranged illumination beam path, a splitter plate on which the PP or the MTP is set for generating a detection beam path, and optical means for imaging the measurement beam path and reference beam path on a spatially resolving detector array of a CCD camera which is connected with an evaluating unit or with a computer for determining measurement values. The arrangement particularly provides optical imaging elements for imaging the measurement beam path and reference beam path at different positions on the detector array of the CCD camera simultaneously and without overlap, a monochromator which comprises a plurality of interference filters and which is arranged subsequent to the light source in the illumination beam path; a component assembly which collimates the illumination beam path, is formed of optical elements and is arranged between the monochromator and the splitter plate; and specimen plate or microtiter plate, and an optical imaging element for complete spatal separation of the measurement beam path and reference beam path in, or in the vicinity of, an intermediate inage plane or aperture diaphragm plane.

Arrangement for detecting biomolecular reactions and interactions

A microscope system for detecting the emission distribution of specimens which emit light at least in a punctiform manner, particularly for failure analysis of integrated circuits, comprises an imaging beam path from the specimen in the direction of an at least one-dimensional receiver distribution, wherein at least one element is provided in the imaging beam path for spectral division of the light which is emitted at least in a punctiform manner.

Microscope system for the detection of emission distribution and process

Process and apparatus for detecting structural changes of specimens

Arrangement for analysis of substances at the surface of an optical

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Jena, Germany

Dieter Graefe