Acacia Communications, Inc.

Analog Photonics LLC

Diedrik Vermeulen

Christopher Richard Doerr

Ehsan Shah Hosseini

Christopher Vincent Poulton

Michael Robert Watts

Long L Chen

Peter Nicholas Russo

Eric A Swanson

Jon Stahl

Michael J Whitson

Erman Timurdogan

Matthew Byrd

Saeid Azemati

Patrick Callahan

Michael Dubrovsky

Systems and methods for generating a virtual environment for implementing an integrated photonics assembly are presented. An example system can include one or more processors and a memory coupled with the processors, where the processor executes a plurality of modules stored in the memory. The plurality of modules can include a user interface module for deploying one or more virtual photonic integrated subcircuits within the virtual environment, in which the virtual environment is configured to enable coupling of at least two virtual photonic integrated subcircuits. The coupling of the virtual photonic integrated subcircuits can form a virtual integrated photonics assembly. The modules can include a library module comprising a plurality of virtual photonic integrated subcircuits. One or more virtual photonic integrated subcircuits can include a performance characteristic. The performance characteristic can represent a real-world performance characteristic of a pre-fabricated physical photonic integrated subcircuit corresponding to the virtual photonic integrated subcircuit.

Virtual environment for implementing integrated photonics assemblies

Disclosed herein are designs, structures and techniques for advanced packaging of multi-function photonic integrated circuits that allow such high-performance multi-function photonic integrated circuits to be co-packaged with a high-performance multi-function ASIC thereby significantly reducing strenuous interconnect challenges and lowering costs, power and size of the overall devices.

Co-packaging photonic integrated circuits and application specific integrated circuits

Aspects of the present disclosure describe wavelength division multiplexed LiDAR systems, methods, and structures that advantageously provide a wide field of view without employing lasers having a large tuning range.

Wavelength division multiplexed LiDAR

Aspects of the present disclosure describe systems, methods, and structures for aberration correction of optical phased arrays that employ a corrective optical path difference (OPD) in the near-field of an OPA to correct or cancel out aberrations in emitted beams of the OPA including those reaching far-field distances by generating a spatially-varying OPD across the aperture of the OPA that is substantially equal and opposite to an equivalent OPD of the aberration(s).

Aberration correction of optical phased arrays

A first photonic die has a first coupling edge and a first die surface, and comprises: a first waveguide extending in proximity to the first coupling edge; a portion of the first die surface forming an alignment edge substantially parallel to the first waveguide; and a first alignment feature etched into or formed adjacent to the first coupling edge. A second photonic die has a second coupling edge and a second die surface, and comprises: a second waveguide extending in proximity to the second coupling edge; a portion of the second die surface configured to form a receptacle sized to constrain a position of the alignment edge; and a second alignment feature etched into or formed adjacent to the second coupling edge and configured to enable alignment with the first alignment feature when the first photonic die and the second photonic die are substantially aligned with each other.

Photonic die alignment

Aspects of the present disclosure describe systems, methods, and structures&#x2014;including LiDAR&#x2014;that employ multiple detectors that may determine multiple incident angles of multiple received radiation beams and advantageously do not require or employ phase shifters in illustrative embodiments and may instead&#x2014;employ optical Fourier transform structures.

Integrated optical structures for LiDAR and other applications employing multiple detectors

An internal laser component of an optical device comprises: a waveguide that defines a guided mode of a first optical wave characterized by a first propagation constant associated with a first effective refractive index. An optical antenna grating comprises: a waveguide that defines a guided mode of a second optical wave characterized by a second propagation constant associated with a second effective refractive index, and a grating structure configured to emit a portion of the second optical wave in a selected direction. The internal laser component and the optical antenna grating are configured to provide a relationship between the first effective refractive index and the second effective refractive index such that the selected direction is substantially insensitive to a change in a temperature of a thermal environment in which the internal laser component and the optical antenna grating are thermally coupled.

Athermal angular output by combining a laser with a grating based antenna

Structures and methods for passively aligning a photonic die with a receiving substrate are described. Three alignment surfaces, having dimensions greater than a desired alignment accuracy, may be formed on the photonic die and used to passively and accurately align the photonic die to a receiving substrate in six degrees of freedom. Two of the three alignment surfaces on the photonic die may be formed in a single mask-and-etch process, while the third alignment surface may require no patterning or etching. Three complementary alignment surfaces on the receiving substrate may be formed in a single mask-and-etch process.

Techniques to combine two integrated photonic substrates

Disclosed herein are methods, structures, and devices for wafer scale testing of photonic integrated circuits.

Wafer-scale testing of photonic integrated circuits using horizontal spot-size converters

Aspects of the present disclosure describe systems, methods, and structures for optical phased array calibration that advantageously may be performed as a single-pass measurement of phase offset with respect to only a single interference measurement. In sharp contrast to the prior art&#x2014;systems, methods, and structures according to aspects of the present disclosure advantageously produce phase offsets and phase functions of each element without time-consuming iterative procedures or multiple detector signals as required by the prior art.

Growing community of inventors

Somerville, MA, United States of America

Diedrik Vermeulen