Burke E. Porter Machinery Company

Lambda-x

Verhaert New Products & Services Nv

Lambda-x Ophthalmics

Didier Beghuin

Koen Verhaert

Kris De Sloovere

Luc Joannes

Philippe Antoine

A system for measuring () a sample () by deflectometry comprising:

Deflectometry measurement system

Described herein is a hyperspectral imaging system in which a polarizing beam splitter, a Wollaston prism, an optical system, and a plane mirror are arranged on an optical axis of the imaging system. An imaging detector is provided on which radiation is focused by an imaging lens. The Wollaston prism is imaged on itself by the optical system and the plane mirror so that translation of the Wollaston prism in a direction parallel to a virtual split plane of the prism effectively provides an optical path length difference that is the same for all points in the object field.

Hyperspectral imaging

The present invention relates to a Fourier transform deflectometry system () and method for the optical inspection of a phase and amplitude object () placed in an optical path between a grating () and an imaging system (), at a distance h of said grating. The grating () forms a contrast-based periodic pattern with spatial frequencies &#x3bc;, vin, respectively, orthogonal axes x,y in an image plane, and the imaging system () comprises an objective () and an imaging sensor () comprising a plurality of photosensitive elements. Spatial frequencies &#x3bc;, vare equal or lower than the Nyquist frequencies of the imaging system in the respective x and y axes. According to the method of the invention, a first image of said pattern, distorted by the phase and amplitude object (), is first captured through the objective () by the imaging sensor (). Then, a Fourier transform of said first image in a spatial frequency domain is calculated, at least one first- or higher-order spectrum of said Fourier transform is selected and shifted in said frequency domain, so as to substantially place it at a central frequency of said Fourier transform, and a reverse Fourier transform said at least one shifted first- or higher-order spectrum of said Fourier transform is performed so as to obtain a complex function g(x,y)=l(x,y)ei&#x3c6;(x,y), wherein l(x,y) is an intensity and &#x3c6;(x,y) a phase linked to optical deflection angles &#x3b8;, &#x3b8;in, respectively, the directions of the x and y axes, in the following form: &#x3c6;(x,y)=&#x2212;2&#x3c4;&#x3c4;h(&#x3bc;tan &#x3b8;+vtan &#x3b8;y).

Fourier transform deflectometry system and method

A method of determining alignment characteristics of a tire and wheel assembly mounted on a vehicle comprises projecting a light plane onto the tire and wheel assembly to form a reference illumination line, receiving a reflected image of the reference illumination line with a photo electric device, and determining a reference distance from the reference illumination line to a noncontact wheel alignment sensor including the photo electric device. The method also includes projecting a plurality of light planes onto the tire and wheel assembly to form a plurality of generally parallel illumination lines, receiving a reflected image of at least some of the generally parallel illumination lines with the photo electric device, and identifying which generally parallel illumination lines are imaged at the receiving step using the reference distance, and determining the orientation of the tire and wheel assembly based on the reflected image of the generally parallel illumination lines.

Non contact wheel alignment sensor and method

A sensor and method of determining the orientation of an object, such as the alignment characteristics of a tire and wheel assembly mounted on a vehicle, includes projecting a plurality of light planes from a first light projector onto a tire and wheel assembly to form a plurality of generally parallel illumination lines on a tire of the tire and wheel assembly, receiving a reflected image of at least some of the illumination lines with a photo electric device reflected from the tire at an angle relative to a projecting angle of the first light projector, and determining a plane defined by spatial coordinates from a selected point located on each illumination line imaged by the photo electric device, with the plane representing the orientation of the tire and wheel assembly.

Growing community of inventors

Enghien, Belgium

Didier Beghuin