Panalytical B.v.

Malvern Panalytical B.v.

Koninklijke Verkade N.v.

Dick Kuiper

Milen Gateshki

Waltherus W Van Den Hoogenhof

Alexander Kharchenko

Petronella Emerentiana Hegeman

Charalampos Zarkadas

Alexander Karchenko

Bruno Alfred Robert Vrebos

Saskia Maria Angela Beerkens

Matthieu Van Son

Waltherus Van Den Hoogenhof

Quantitative X-ray analysis is carried out by making X-ray fluorescence measurements to determine the elemental composition of a sample and a correction measurement by measuring the transmitted intensity of X-rays at an energy E transmitted directly through the sample without deviation. An X-ray diffraction measurement is made in transmission by directing X-rays from an X-ray source at the energy E onto a sample at an incident angle &#x3c8;to the surface of the sample and measuring a measured intensity I(&#x3b8;) of the diffracted X-rays at the energy E with an X-ray detector at an exit angle &#x3c8;corresponding to an X-ray diffraction peak of a predetermined component. A matrix corrected X-ray intensity is obtained using the measured X-ray intensity in the X-ray diffraction measurement, the correction measurement and the mass attenuation coefficient of the sample calculated from the elemental composition and the mass attenuation coefficients of the elements.

Quantitative X-ray analysis&#x2014;matrix thickness correction

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Almelo, Netherlands

Dick Kuiper