Charter Communications Operating, LLC

Diana Linton

Esteban Sandino

John W Williams

A radio frequency (RF) amplifier assembly includes modular amplification and processing units, which can be easily installed or replaced in the housing of the RF amplifier assembly, e.g., in response to changing needs and/or changing capabilities in the cable network communications system. The RF amplifier housing facilitates, e.g., via slots with connectors, accepting and coupling of alternative modular units, which can be installed/removed. The RF amplifier assembly includes a first spectrum (e.g., legacy spectrum) amplification and processing circuit, supporting both upstream and downstream signaling. The RF amplification assembly further includes one or more optional additional (extended) spectrum amplification and processing circuits, which are removeable modular units, and which support downstream signaling over extended spectrum. The RF amplifier assembly further includes spectrum splitter/combiner circuits, e.g., implemented in some embodiments using a diplexer-less design, for splitting/combining spectrum blocks with regard to multiple amplification and processing circuits installed within the RF amplifier assembly.

Apparatus for supporting amplification and processing of RF signals corresponding to a combined spectrum that includes legacy bandwidth and additional extended bandwidth

A notched test signal is generated across a frequency band, the notched test signal includes a plurality of frequency notches, each frequency notch associated with one of a plurality of test frequencies. The notched test signal is provided to a device under test at a plurality of different input power levels. An notched output signal is received from the device under test. The notched output signal is filtered to provide a bandpass response at the plurality of test frequencies to generate a filtered notched output signal. A power level of the filtered notched output signal at each of the plurality of test frequencies is measured. A noise performance metric associated with the device under test is determined based at least in part on the power level of the filtered notched output signal.

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Parker, CO, United States of America

Diana Linton