Koninklijke Philips Corporation N.v.

Dhruv Mehta

Amar Chandra Dhanantwari

Yael Nae

A method includes determining a low contrast detectability of a scan and generating an image quality index based on the determined low contrast detectability. Another method includes identifying an image quality index of interest, identifying an acquisition and/or reconstruction parameter based on the image quality index and a pre-determined mapping between image quality indexes and acquisition parameter and reconstruction parameters, and displaying the identified acquisition and/or the reconstruction parameter. A system () includes a metric determiner () that determines a first image quality index for a scan based on at least one of a low contrast detectability of the scan or a project domain noise of the scan, and/or a parameter recommender () that recommends at least one of an acquisition or a reconstruction parameter for a scan based on a second image quality index, and a display () that visually presents the first or second image quality index.

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South Euclid, OH, United States of America

Dhruv Mehta