Fei Comapny

Dhruti Trivedi

Stacey Stone

Jeffrey Blackwood

Thomas Gary Miller

Michael Schmidt

Richard J Young

Brian Routh, Jr

Tom Miller

Jeff Blackwood

Valerie Brogden

Todd Templeton

Jr Brian Routh

Techniques are described that facilitate automated extraction of lamellae and attaching the lamellae to sample grids for viewing on transmission electron microscopes. Some embodiments of the invention involve the use of machine vision to determine the positions of the lamella, the probe, and/or the TEM grid to guide the attachment of the probe to the lamella and the attachment of the lamella to the TEM grid. Techniques that facilitate the use of machine vision include shaping a probe tip so that its position can be readily recognized by image recognition software. Image subtraction techniques can be used to determine the position of the lamellae attached to the probe for moving the lamella to the TEM grid for attachment. In some embodiments, reference structures are milled on the probe or on the lamella to facilitate image recognition.

Automated TEM sample preparation

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Watervliet, NY, United States of America

Dhruti Trivedi