Flir Systems, Incorporated

Praevium Research, Inc.

Devin Leonard

Vijaysekhar Jayaraman

Richard E Bornfreund

Gregory A Carlson

Tiahaar Kurtheru Clayton McKenzie

Timothy Andrew Strand

Systems and methods may be provided for generating reduced-height circuit packages such as infrared detector packages. An alignment and dicing system may include an infrared camera that captures images of alignment marks of a wafer assembly through a lid wafer of the wafer assembly, a light source that illuminates the alignment marks through the lid wafer, and dicing equipment that dices the wafer assembly based on infrared images captured using the infrared camera. The light source may illuminate the alignment marks through the lid wafer by providing light such as infrared light to the wafer assembly through optics of the infrared camera. The infrared camera may capture images of alignment marks formed on a detector wafer of the wafer assembly or on an interior or lower surface of the lid wafer through the lid wafer. The dicing equipment may be aligned with the wafer assembly based on the captured images.

Wafer level packaging of reduced-height infrared detectors

The invention discloses a system for optical spectroscopy comprising a multi-wavelength semiconductor light source comprising a plurality of semiconductor light sources disposed on a silicon sub-carrier and emitting a plurality of radiation components spanning a wavelength range. The radiation components are coupled to a waveguide array disposed on the same silicon subcarrier. Output from the waveguide array provides a compact multi-wavelength laser source with wide tuning range via a plurality of laser sources. The system further comprises means for directing radiation components to a sample, and an optical detector configured to detect one of a radiation reflected from and transmitted through said sample. The system can be used in a variety of applications including the analysis of in-vivo human tissue, agricultural samples, and pharmaceutical samples. Typical wavelength ranges are 650-1000 nm, 700-1700 nm, and 1100-2500 nm.

Multi-wavelength light source for spectroscopy

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Santa Barbara, CA, United States of America

Devin Leonard