Amazon Technologies, Inc.

Devesh R Raval

Sameer R Rajyaguru

Zhuo Zhang

Ivan Eduardo Gonzalez

Patrick Ludvig Bajari

Harry J Paarsch

This disclosure is directed to measuring test effects using adjusted outlier data. Test data and control data may include some outlier data (i.e., right-side tails of distribution curves), which may bias the resultant data. The outlier data may be adjusted to reduce bias. A cutoff point is selected along the distribution of data. Data below the cutoff is maintained and used to determine an effect of the data below the cutoff point. The effect of the data above the cutoff may be processed as follows. Predictor data is identified from the data below, but near, the cutoff point. The predictor data may then be used determine the effect of the outlier data that is above the cutoff point. In some embodiments, the predictor data may be weighted and combined with a weighted portion of the outlier data to determine an effect of the data above the cutoff point.

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Seattle, WA, United States of America

Devesh R Raval