Posco

Deuk-Jung Kim

Kyong-Su Park

Hyoung-Kuk Park

Jung-Hyeung Lee

Chon-Kue Kim

A process control system according to one embodiment of the present invention comprises: a first system for generating thickness information about an internal defect layer included in a carbon steel product; and a second system which receives the thickness information about the internal defect layer from the first system through a network, and which controls an etching process for removing at least a part of the internal defect layer from the carbon steel product by using the thickness information about the internal defect layer, wherein the first system provides the second system with a calculation module necessary for the second system to control the etching process, and the second system provides the first system with the information necessary for the first system to update the calculation module.

Growing community of inventors

Pohang-si, South Korea

Deuk-Jung Kim