Other

Vdeh-betriebsforschungsinstitut Gmbh

Gom Gesellschaft Fur Optische Messtechnik Mbh

Gom Gesellschaft Für Optische Meßtechnik Mbh

Detlef Winter

Gustav Peuker

Detlef Sonnenschein

Ulrich M&uuml;ller

Gerd Thiemann

Ulrich Muller

Michael Degner

Mladen Gomercic

Rudolf Stockmeyer

A projector for an arrangement for three-dimensional optical measurement of objects () with the aid of a topometric measuring method in which images of projection patterns () projected onto an object () are acquired and evaluated, the projector having an illumination unit () and a carrier (), provided with projection patterns (), for projecting the light structures. The object is achieved by virtue of the fact that projection patterns () are arranged on the carrier () in the form of repeating geometrical individual structures, and the carrier () with the projection patterns () is movably arranged in such a way that during the movement and illumination selected regions of the projection pattern () are displaced into the beam path () between the illumination unit () and object (), and a stripe-shaped pattern is imaged on the object () by means of the movement unsharpness.

Projector for an arrangement for three-dimensional optical measurement of objects

The invention relates to a device for producing a pattern on a surface for measuring, using a projector and a slide. The invention also relates to various advantageous embodiments of the measuring system.

System for measuring the surface geometry and surface evenness of flat products

The invention relates to a flatness measurement and control system for metal strip, which makes it possible to obtain improved strip or coil quality by a simple and effective measurement of departures from flatness and to control the finishing parameters through the evaluation of a line pattern on the strip surface or on the end face of a coil as it is coiled.

Flatness measurement system for metal strip

Growing community of inventors

Vordorf, Germany

Detlef Winter