Witec Wissenschaftliche Instrumente Und Technologie Gmbh

Detlef Sanchen

Peter Spizig

Gerhard Volswinkler

Othmar Marti

Olaf Hollricher

Jörg Förstner

Joachim Koenen

Wolfram Ibach

Wofram Ibach

A device for imaging the surfaces of a sample having topography with the aid of confocal microscopy, in particular confocal Raman and/or fluorescence microscopy, comprising a first light source, in particular a laser light source for generating excitation radiation, in particular Raman radiation and/or fluorescence radiation and a second light source, wherein the first laser light source emits radiation in a first wavelength range and the second light source emits radiation in a second wavelength range, wherein the first wavelength range and the second wavelength range do not overlap.

Device for imaging a sample surface

The invention relates to an apparatus and a method for imaging surface area of a sample having a surface topography with the aid of confocal microscopy, such as confocal Raman and/or fluorescence microscopy. The apparatus comprises a surface topography sensor that provides values for the surface topography. The surface topography values allow for the surface to be maintained in the confocal plane during scanning.

Apparatus for imaging a sample surface

Microscope, in particular a scanning probe microscope, comprising a programmable logic device.

Scanning probe in pulsed-force mode, digital and in real time

The invention relates to a method for creating the image of a sample surface to be analyzed, with a resolution which is better than 1 &#x3bc;m laterally in relation to the sample surface and better than 100 nm vertically in relation to said surface. According to the invention, the surface is scanned on a point-by-point basis by a scanning probe, the distance between the scanning probe and the sample surface at each scanning point being periodically modulated, in such a way that a force-time curve of the probe is produced for this point. The force-time curve is recorded at each scanning point, digitized using an A/D converter, evaluated online in real-time and stored, together with the entire data stream, in a first area of a memory device. One or several characteristic variables of the force-time curves are determined for each scanning point from the real-time evaluation results and the stored digitized force-time curves and an image of the sample surface is obtained from said characteristic variables of the scanning points.

Growing community of inventors

Blaustein, Germany

Detlef Sanchen