Bruker Axs Gmbh

Other

Incoatec Gmbh

Detlef Bahr

Joachim Lange

Carsten Michaelsen

Norbert Kuhnmuench

Andreas Kleine

Norbert Kuhnmünch

Nima Bashiry

Kurt Erlacher

A method for adjusting a primary side of an X-ray diffractometer wherein the primary side comprises a collimator, X-ray optics, an X-ray source, in particular an X-ray tube, wherein the collimator, the X-ray optics and the X-ray source are mounted directly or indirectly on a base structure, and wherein the orientation and position of the X-ray optics and the position of the X-ray source are adjusted relative to the base structure, wherein the method is characterized in that the orientation and position of the X-ray optics and the position of the X-ray tube relative to the base structure are measured and set at predetermined target values, so that with these set target values, X-ray radiation emanating from the X-ray source and conditioned by the X-ray optics is detectable at the output end of the collimator.

Method of adjusting the primary side of an X-ray diffractometer

An X-ray optical system with two X-ray mirrors (A,B) for imaging an X-ray source (S) on a target region is characterized in that the X-ray mirrors (A,B) are mutually tilted by an angle other than 90&#xb0; such that the combined region of acceptance of the X-ray mirror (A,B) is adjusted to the shape of the X-ray source (S) and/or the target region. This increases the intensity of the focused X-ray radiation on the sample for a given emission of the X-ray source (S) power using a few, technically simple modifications.

X-ray optical system and method for imaging a source

An X-ray optical system with an X-ray source (Q) and a first graded multi-layer mirror (A), wherein the extension Qof the X-ray source (Q) in an x direction perpendicular to the connecting line in the z direction between the X-ray source (Q) and the first graded multi-layer mirror (A) is larger than the region of acceptance (F) of the mirror (A) at a focus (O) of the mirror (A) in the x direction, is characterized in that a first collimator (bl) is disposed at a focus of the first graded multi-layer mirror (A) between the X-ray source (Q) and the mirror (A) whose opening in the x direction corresponds to the region of acceptance of the first graded multi-layer mirror (A) and the separation qbetween first collimator (bl) and X-ray source (Q) is:/tan &#x3b1;,wherein &#x3b1;is the angle subtended by the first graded multi-layer mirror (A) in the x direction, as viewed from the first collimator (bl). This permits reduction of the disturbing radiation on the sample for constant useful X-radiation power from the source Q.

X-ray optical system with collimator in the focus of an X-ray mirror

An X-ray diffractometer comprising an X-ray source ( ) from which X-rays are guided to a sample ( ) to be investigated, an X-ray detector ( ) for receiving X-rays diffracted or scattered from or reflected by the sample ( ), and a goniometer for adjustment of sequential relative angular positions between the X-ray source ( ), the sample ( ) and the X-ray detector ( ) for detecting X-ray diffraction lines, X-ray scattered signals or X-ray reflectograms of the sample ( ) to be investigated, wherein the X-rays can be guided at least sectionally along different optical paths, is characterized in that the X-rays can be guided from a position to a position along n&gE;2 different switchable optical paths, wherein the different optical paths are rigidly disposed relative to each other between position and position and form a unit ( ), wherein the sample ( ) assumes either position or position and wherein the switching over between the different optical paths can be effected by turning the unit ( ) relative to the sample ( ) about the sample position. Due to its considerably more compact structure compared to conventional arrangements, the inventive arrangement requires considerably less space while maintaining full relative motion of the parts, wherein the arrangement permits omission of expensive components, in particular detectors and associated measurement electronics.

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Karlsruhe, Germany

Detlef Bahr