Meyer Burger (germany) Gmbh

Pasan Sa

Meyer Burger Gmbh

Derk Bätzner

Pierre Papet

Benjamin Strahm

Damien Lachenal

Patrick Volluz

Gilles Arnoux

Nicolas Bassi

Nicolas Frick

Pierre-René Beljean

Disclosed is a method for measuring and calculating a current-voltage curve and a current mismatch between junctions of a tandem solar cell, including at least two solar subcells, the method being performed under simulated solar irradiance according to the international standard illumination AM1.5. The method implies the illumination by a first broad-spectral band light source S1 and includes steps for calculating the necessary light intensities of narrow-band second and the third light sources. The steps of the method achieve to determine adapted gains for second and the third light sources, so that the combination of the light sources S2and S2provide the same test results of the solar cell as when illuminated with the first light source S1 only. Also disclosed is a solar cell test apparatus configured to realize the method of the invention.

Photovoltaic device test method and test apparatus

Disclosed is an interdigitated back contact photovoltaic device that includes a first patterned silicon layer situated on an intrinsic layer, and having the same type of doping as the one of the substrate. First charge collection portions are deposited on predetermined areas of the intrinsic layer, and include each an amorphous layer portion situated between the predetermined areas and the at least partially nano-crystalline layer portions. The amorphous layer portions have a larger width than the width of the nano-crystalline layer portions. On top if the first patterned silicon layer, a second nano-crystalline silicon layer is deposited that has a doping of a second type being the other of the p-type doping or the n-type doping with respect to the doping-type of the first patterned silicon layer.

Photovoltaic device and method for manufacturing the same

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Ins, Switzerland

Derk Bätzner