Photothermal Spectroscopy Corp.

Derek Decker

Craig Prater

David A Grigg

Roshan Shetty

Asymmetric interferometry is used with various embodiments of Optical Photothermal Infrared (OPTIR) systems to suppress thin film interference effects.

Asymmetric quadrature interferometry for thin film interference suppression in optical photothermal infrared spectroscopy

Apparatuses and methods for microscopic analysis of a sample by simultaneously characterizing infrared absorption characteristics of a plurality of spatially resolved locations are described herein. These apparatuses and methods improve sampling times while collecting microscopic data regarding composition of a sample across a wide field.

Wide area optical photothermal infrared spectroscopy

A system for infrared analysis over a wide field area of a sample is disclosed herein that relies on interference of non-diffractively separated beams of light containing image data corresponding to the sample, as well as a photothermal effect on the sample.

Method and apparatus for high performance wide field photothermal imaging and spectroscopy

Asymmetric interferometry is used with various embodiments of Optical Photothermal Infrared (OPTIR) systems to enhance the signal strength indicating the photothermal effect on a sample.

Asymmetric interferometric optical photothermal infrared spectroscopy

Apparatuses and methods for microscopic analysis of a sample using spatial light manipulation to increase signal to noise ratio are described herein.

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Carmel, CA, United States of America

Derek Decker