Teradyne, Inc.

Derek Castellano

Frank Parrish

Arash Behziz

Arthur E LeColst

Donald Eric Thompson

Jonathan M Becker

Keith J Breinlinger

Brian Brecht

Kevin P Manning

The traditional device interface board is replaced by a number of smaller strips containing one or more electrical components for interfacing the device under test and the test head. The device interface modules may mount to a stiffening member having a back bone and multiple ribs running through the stiffening member. The device interface strips can create a lattice-like structure for the interface circuitry. Individual circuits may be disposed on the interface strips to perform functionality relating to the device under test and/or the test head.

Modularized device interface with grounding insert between two strips

A coaxial cable for transmitting high frequency signals includes includes a body having a center conductor and a shield formed coaxially around the center conductor and separated from the center conductor by a layer of dielectric having an annular layer of electro-static-discharge polymer. The cable also includes conductive pads to engage contacts on a mating connector. At least one of the conductive pads is attached to the center conductor and at least another one of the conductive pads is attached to the shield.

Coaxial cable for overvoltage protection

Automatic test equipment adapted for testing a plurality of devices-under-test (DUTs) is disclosed. The automatic test equipment includes a mainframe computer and a test head coupled to the mainframe computer. The test head includes a low-profile tester interface having a first interface board and a device board. The device board engages contact points on the DUTs and includes a topside. A hard stop is mounted to the first interface board and defines a reference plane. The hard stop is adapted to engage the device board topside to vertically fix the device board, positionally with respect to the first interface board. The automatic test equipment further includes a compliant interconnect array adapted for compression between the first interface board and the device board.

Low compliance tester interface

A tester interface assembly is disclosed for coupling a plurality of tester electronic channels to a device-interface-board. The tester interface assembly includes at least one harness assembly having a plurality of coaxial cables, each cable including a body having a center conductor and a shield. The shield is formed coaxially around the center conductor and separated therefrom by a layer of dielectric. Each cable further includes a distal tip formed substantially similar to the body and including respective formed conductive pads disposed on the distal extremities of the center conductor and the shield. The harness employs a housing formed with an internal cavity for receiving and securing the cable distal ends in close-spaced relationship such that the distal tips form an interface engagement plane. A compliant interconnect is interposed between the harness assembly and the device-interface-board, and includes a plurality of conductors formed to engage the cable distal ends along the engagement plane.

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Simi Valley, CA, United States of America

Derek Castellano