Dwfritz Automation, Inc.

Industrial Metrology Solutions LLC

Derek Aqui

Shawn Boling

Chris Barns

Mark William Baker

Robert Batten

Clint Vandergiessen

Jared Greco

Garrett Headrick

Bhaskar Ramakrishnan

Disclosed is a non-contact optical measurement device for detecting or measuring different geometric workpiece features based on configurable light-propagation paths of light emitted from a light source and reflected by a workpiece surface for incidence upon a spectral sensor. The light-propagation paths are configurable based on which optical probe is attached to a rotation stage that rotates the probe about an optical axis and in a collimated region.

Non-contact optical measurement devices and exchangeable optical probes

Apparatuses, systems and methods associated with a metrology system for high-speed, non-contact coordinate measurements of parts are disclosed herein. In embodiments, the metrology system includes a metrology bridge to be coupled to a measurement assembly. The measurement assembly may include a stage moveable across multiple independent axes. The bridge may include a housing, mounting members coupled to the housing, and a plurality of sensors mounted within the housing. The mounting members may rotatably couple the housing to the measurement assembly. Further, sensor elements of the plurality of sensor devices may be aligned along a length of the housing and may be directed out of the housing.

Metrology system

Growing community of inventors

Wilsonville, OR, United States of America

Derek Aqui