Palo Alto Research Center Inc.

Panasonic Holdings Corporation

Deokwoo Jung

Ajay Raghavan

Hong Yu

Saman Mostafavi

Fangzhou Cheng

Tetsuyoshi Ogura

Akira Minegishi

Yosuke Tajika

Yukinori Sasaki

One embodiment can provide a system for detecting anomaly for high-dimensional sensor data associated with one or more machines. During operation, the system can obtain sensor data from a set of sensor associated with one or machines, generate a first set of outputs by using a set of clustering models learned in parallel from the unlabeled sensor data and user-provided partial label information, generate a second set of outputs by using a set of feed-forward neural network (FNN) models learned in parallel from the first set of outputs and the unlabeled sensor data, and determine whether an anomaly is present in the operation of the one or more machines based on the second set of outputs and a user-specified threshold.

Method and system for semi-supervised anomaly detection with feed-forward neural network for high-dimensional sensor data

A system and method are provided for determining a causal inference in a manufacturing process. During operation, the system can receive data associated with a processing system which includes a set of interconnected machines and an associated set of processes. The system can generate, based on the data, a graph indicating flows of outputs between the machines as part of the processes. The system can determine, based on a set of variables, one or more candidate clusters in the graph. The system can perform, based on one or more variables of interest, root cause analysis on the one or more candidate clusters by: applying an additive noise model to prune the one or more candidate clusters from the graph; and determining, based on the pruned graph, a candidate pathway likely to cause an issue in at least one process, thereby facilitating improved efficiency in the processing system.

System and method for casual inference in manufacturing process

One embodiment can provide a system for detecting anomaly for high-dimensional sensor data associated with one or more machines. During operation, the system can obtain sensor data from a set of sensor associated with one or machines, apply data exploration techniques on the sensor data to automatically process sensor data to identify a subset of feature sensors from the available set of feature sensors, apply an unsupervised machine-learning technique to the identified subset of feature sensors and the target sensor to learn a set of pair-wise univariate models, and determine whether and how an anomaly occurs in the operation of the one or more machines based on the set of pair-wise univariate models.

Method and system for unsupervised anomaly detection and accountability with majority voting for high-dimensional sensor data

One embodiment of the present invention can provide a system for identifying a root cause of an anomaly event in operation of one or more machines is provided. During operation, the system can obtain sensor data from a set of sensors associated with the one or more machines, convert the sensor data into a set of sensor states, build an optimal DAG based on the set of sensor states to model causal dependency; determining, by using the DAG, a probability of an anomaly state of a target sensor given a state of a direct neighbor sensor, and determining a root cause of the anomaly event associated with the target sensor by back-tracking the anomaly state in the DAG.

Method and system for performing automated root cause analysis of anomaly events in high-dimensional sensor data

A system is provided for determining causes of faults in a manufacturing system. The system stores data associated with a processing system which includes machines and associated processes, wherein the data includes timestamp information, machine status information, and product-batch information. The system determines, based on the data, a topology of the processing system, wherein the topology indicates flows of outputs between the machines as part of the processes. The system determines information of machine faults in association with the topology. The system generates, based on the machine-fault information, one or more fault parameters which indicates frequency and severity of a respective fault. The system constructs, based on the topology and the machine-fault information, a system model which includes the one or more fault parameters, thereby facilitating diagnosis of the processing system.

System and method for constructing fault-augmented system model for root cause analysis of faults in manufacturing systems

One embodiment can provide a system for estimating useful life of a load-bearing structure. During operation, the system can perform a degradation measurement on the structure to obtain degradation data for a predetermined time interval, apply a constraint convex regression model to the degradation data, estimate a total useful life (TUL) of the structure based on outputs of the constraint convex regression model, and predicting a remaining useful life (RUL) based on the TUL and a current time.

Adaptive remaining useful life estimation method using constraint convex regression from degradation measurement

One embodiment can provide a system for detecting faults in a machine. During operation, the system can obtain a dynamic signal associated with the machine, apply one or more signal-processing techniques to the dynamic signal to obtain frequency, amplitude, and/or time-frequency information associated with the dynamic signal, extract motion-insensitive features from the obtained frequency, amplitude, and/or time-frequency information associated with the dynamic signal, and determine whether a fault occurs in the machine based on the extracted features.

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Mountain View, CA, United States of America

Deokwoo Jung